![](/img/cover-not-exists.png)
A Novel Characterization Scheme of Interface Roughness for Surface Roughness Scattering-Limited Mobilities of Electrons and Holes in Unstrained- and Strained-Si MOSFETs
Yi Zhao, Matsumoto, H., Sato, T., Koyama, S., Takenaka, M., Takagi, S.Volume:
57
Year:
2010
Language:
english
Pages:
10
DOI:
10.1109/ted.2010.2052394
File:
PDF, 971 KB
english, 2010