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Statistical Simulation of Progressive NBTI Degradation in a 45-nm Technology pMOSFET
Brown, A.R., Huard, V., Asenov, A.Volume:
57
Year:
2010
Language:
english
Pages:
4
DOI:
10.1109/ted.2010.2052694
File:
PDF, 635 KB
english, 2010