Highly Reliable Amorphous Silicon Gate Driver Using Stable...

IEEE Transactions on Electron Devices 2010 Vol. 57; Iss. 9

Highly Reliable Amorphous Silicon Gate Driver Using Stable Center-Offset Thin-Film Transistors

Jae Won Choi, Jae Ik Kim, Se Hwan Kim, Jin Jang
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Volume:
57
Year:
2010
Language:
english
Pages:
5
DOI:
10.1109/ted.2010.2054453
File:
PDF, 661 KB
english, 2010
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