Comprehensive Investigation of Statistical Effects in...

IEEE Transactions on Electron Devices 2010 Vol. 57; Iss. 9

Comprehensive Investigation of Statistical Effects in Nitride Memories—Part I: Physics-Based Modeling

Mauri, A., Compagnoni, C.M., Amoroso, S.M., Maconi, A., Ghetti, A., Spinelli, A.S., Lacaita, A.L.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
57
Year:
2010
Language:
english
Pages:
8
DOI:
10.1109/ted.2010.2054472
File:
PDF, 794 KB
english, 2010
Conversion to is in progress
Conversion to is failed