Comprehensive Investigation of Statistical Effects in...

IEEE Transactions on Electron Devices 2010 Vol. 57; Iss. 9

Comprehensive Investigation of Statistical Effects in Nitride Memories—Part II: Scaling Analysis and Impact on Device Performance

Monzio Compagnoni, C., Mauri, A., Amoroso, S.M., Maconi, A., Greco, E., Spinelli, A.S., Lacaita, A.L.
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Volume:
57
Year:
2010
Language:
english
Pages:
8
DOI:
10.1109/ted.2010.2054491
File:
PDF, 583 KB
english, 2010
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