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High-Reliability Dynamic-Threshold Source-Side Injection for 2-Bit/Cell With MLC Operation of Wrapped Select-Gate SONOS in nor-Type Flash Memory
Kuan-Ti Wang, Tien-Sheng Chao, Woei-Cherng Wu, Wen-Luh Yang, Chien-Hsing Lee, Tsung-Min Hsieh, Jhyy-Cheng Liou, Shen-De Wang, Tzu-Ping Chen, Chien-Hung Chen, Chih-Hung Lin, Hwi-Huang ChenVolume:
57
Year:
2010
Language:
english
Pages:
4
DOI:
10.1109/ted.2010.2054530
File:
PDF, 522 KB
english, 2010