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A Program Disturb Model and Channel Leakage Current Study for Sub-20 nm nand Flash Cells
Torsi, A., Yijie Zhao, Haitao Liu, Tanzawa, T., Goda, A., Kalavade, P., Parat, K.Volume:
58
Year:
2011
Language:
english
Pages:
6
DOI:
10.1109/ted.2010.2087338
File:
PDF, 917 KB
english, 2011