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A Current-Transient Methodology for Trap Analysis for GaN High Electron Mobility Transistors
Jungwoo Joh, del Alamo, J.A.Volume:
58
Year:
2011
Language:
english
Pages:
9
DOI:
10.1109/ted.2010.2087339
File:
PDF, 1.14 MB
english, 2011