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Simulation and Analysis of InGaAs Power MOSFET Performances and Reliability
Steighner, J.B., Jiann-Shiun Yuan, Yidong LiuVolume:
58
Year:
2011
Language:
english
Pages:
10
DOI:
10.1109/ted.2010.2089460
File:
PDF, 1.55 MB
english, 2011