Study of Trap Models Related to the Variable Retention Time...

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 6

Study of Trap Models Related to the Variable Retention Time Phenomenon in DRAM

Heesang Kim, Byoungchan Oh, Younghwan Son, Kyungdo Kim, Seon-Yong Cha, Jae-Goan Jeong, Sung-Joo Hong, Hyungcheol Shin
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Volume:
58
Year:
2011
Language:
english
Pages:
6
DOI:
10.1109/ted.2011.2125964
File:
PDF, 594 KB
english, 2011
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