The Paradigm Shift in Understanding the Bias Temperature...

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 11

The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

Grasser, T., Kaczer, B., Goes, W., Reisinger, H., Aichinger, T., Hehenberger, P., Wagner, P., Schanovsky, F., Franco, J., Luque, M.T., Nelhiebel, M.
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Volume:
58
Year:
2011
Language:
english
Pages:
15
DOI:
10.1109/ted.2011.2164543
File:
PDF, 2.35 MB
english, 2011
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