Shear Piezoresistance in MOSFET Devices Under General...

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 12

Shear Piezoresistance in MOSFET Devices Under General Operating Conditions

Sbierski, B., Gieschke, P., Paul, O.
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Volume:
58
Year:
2011
Language:
english
Pages:
10
DOI:
10.1109/ted.2011.2166556
File:
PDF, 384 KB
english, 2011
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