Modeling the Universal Set/Reset Characteristics of Bipolar...

Modeling the Universal Set/Reset Characteristics of Bipolar RRAM by Field- and Temperature-Driven Filament Growth

Ielmini, D.
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Volume:
58
Year:
2011
Language:
english
Pages:
9
DOI:
10.1109/ted.2011.2167513
File:
PDF, 823 KB
english, 2011
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