Analytical Expressions for Doped Polycrystalline Silicon Thin-Film Transistors in Above-Threshold Regime Consistent With Pao–Sah Model Considering Trapped Charge Effect
Hongyu He, Xueren ZhengVolume:
58
Year:
2011
Language:
english
Pages:
9
DOI:
10.1109/ted.2011.2168404
File:
PDF, 276 KB
english, 2011