Improved Calculation of Charge Collection Probability From...

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 12

Improved Calculation of Charge Collection Probability From Within the Junction Well

Ong, V.K.S., Tan, C.C., Kurniawan, O., Radhakrishnan, K.
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Volume:
58
Year:
2011
Language:
english
Pages:
4
DOI:
10.1109/ted.2011.2169071
File:
PDF, 252 KB
english, 2011
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