Drain-Dependence of Tunnel Field-Effect Transistor...

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 12

Drain-Dependence of Tunnel Field-Effect Transistor Characteristics: The Role of the Channel

Mallik, A., Chattopadhyay, A.
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Volume:
58
Year:
2011
Language:
english
Pages:
8
DOI:
10.1109/ted.2011.2169416
File:
PDF, 1.06 MB
english, 2011
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