Ultrawide Frequency Range Crosstalk Into Standard and...

IEEE Transactions on Electron Devices 2011 Vol. 58; Iss. 12

Ultrawide Frequency Range Crosstalk Into Standard and Trap-Rich High Resistivity Silicon Substrates

Ben Ali, K., Roda Neve, C., Gharsallah, A., Raskin, J.-P.
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Volume:
58
Year:
2011
Language:
english
Pages:
7
DOI:
10.1109/ted.2011.2170074
File:
PDF, 952 KB
english, 2011
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