An optimally self-biased threshold-voltage extractor...

IEEE Transactions on Instrumentation and Measurement 2003 Vol. 52; Iss. 5

An optimally self-biased threshold-voltage extractor [MOSFET circuit parametric testing]

Cilingiroglu, U., Siew Kuok Hoon
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Volume:
52
Year:
2003
Language:
english
Pages:
5
DOI:
10.1109/tim.2003.817903
File:
PDF, 924 KB
english, 2003
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