Volume 52; Issue 5

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IEEE Transactions on Instrumentation and Measurement
Volume 52; Issue 5

IEEE Transactions on Instrumentation and Measurement

Volume 52; Issue 5

1

Improved recursive Newton-type algorithm for frequency and spectra estimation in power systems

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 339 KB

english, 2003

2

Using run-time reconfiguration for fault injection applications

Antoni, L., Leveugle, R., Feher, B.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 233 KB

english, 2003

3

Relay-based gain and phase margins PI controller design

de Arruda, G.H.M., Barros, P.R.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 316 KB

english, 2003

4

Finite-element analysis of the electric field distribution in conductance cell

Szczepanik, Z., Rucki, Z., Moron, Z.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 555 KB

english, 2003

5

Temperature compensation for ultrasound measurements and characterization of materials

Christidis, K., Gunarathne, G.P.P.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 833 KB

english, 2003

6

Digital watermarking-based DCT and JPEG model

Suhail, M.A., Obaidat, M.S.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 539 KB

english, 2003

7

On-wafer noise characterization of low-noise amplifiers in the Ka-band

Long, S., Escotte, L., Graffeuil, J., Brasseau, F., Cazaux, J.L.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 273 KB

english, 2003

8

Bio-geochemically inspired capacitive sensors for heavy metals pollution monitoring

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 1.76 MB

english, 2003

9

Sources of uncertainty in the nose-to-nose sampler calibration method

Paulter, N.G., Larson, D.R.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 478 KB

english, 2003

10

An optimally self-biased threshold-voltage extractor [MOSFET circuit parametric testing]

Cilingiroglu, U., Siew Kuok Hoon

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 924 KB

english, 2003

11

Dielectric constant measurement technique for a dielectric strip using a rectangular waveguide

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 415 KB

english, 2003

12

Adaptive characterization of jitter noise in sampled high-speed signals

Coakley, K.J., Wang, C.-M., Hale, P.D., Clement, T.S.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 510 KB

english, 2003

13

Modeling and analysis of fault tolerant multistage interconnection networks

Minsu Choi, Park, N., Lombardi, F.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 614 KB

english, 2003

14

Acoustic proximity ranging in the presence of secondary echoes

Xi Li, Renbiao Wu, Rasmi, S., Jian Li, Cattafesta, L.N., III, Sheplak, M.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 1.35 MB

english, 2003

15

Registration of range measurements with compact surface representation

Payeur, P., Changzhong Chen

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 985 KB

english, 2003

16

Measurement of some typical parameters in the realization of a signal management plant in railway diagnostics

Zanobini, A., Ghizzani, M.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 535 KB

english, 2003

17

Micro-prober for wafer-level low-noise measurements in MOS devices

Ciofi, C., Crupi, F., Pace, C., Scandurra, G.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 1.03 MB

english, 2003

18

Absence of the relativistic transverse Doppler shift at microwave frequencies

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 257 KB

english, 2003

19

Comments on "New algorithm for measuring 50/60-Hz AC values based on the usage of slow A/D converters" and "Measuring of slowly changing AC signals without sample-and-hold circuit"

Pejovic, P., Saranovac, L., Popovic, M.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 325 KB

english, 2003

20

Measurement of C and tanδ of a capacitor employing PSDs and dual-slope DVMs

Kumar, V.J., Sankaran, P., Rao, K.S.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 276 KB

english, 2003

21

Optimization strategies for parametric analysis of thin-film reflectivity spectra

Schlaf, M., Hagras, H., Sands, D.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 227 KB

english, 2003

22

Reflectometer calibration without an open circuit

Chahine, S.A., Huyart, B., Achkar, J.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 450 KB

english, 2003

23

Analysis of the effect of stray capacitance on an ac-based capacitance tomography transducer

Yang, W.Q., Stott, A.L., Gamio, J.C.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 542 KB

english, 2003

24

Measurement uncertainty in a multivariate model: a novel approach

Iuculano, G., Zanobini, A., Lazzari, A., Gualtieri, G.P.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 999 KB

english, 2003

25

Test limitations of parametric faults in analog circuits

Savir, J., Zhen Guo

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 483 KB

english, 2003

26

Space compaction of test responses using orthogonal transmission functions [logic testing]

Chakrabarty, K., Seuring, M.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 570 KB

english, 2003

27

A cost-effective wafer-level reliability test system for integrated circuit makers

Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 986 KB

english, 2003

28

Architecture, design, and application of an event-based test system

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 4.17 MB

english, 2003

29

Self-checking logic design for FPGA implementation

Lala, P.K., Burress, A.L.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 339 KB

english, 2003

30

An efficient BIST method for non-traditional faults of embedded memory arrays

Jone, W.-B., Der-Chen Huang, Das, S.R.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 412 KB

english, 2003

31

Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets

Das, S.R., Sudarma, M., Assaf, M.H., Petriu, E.M., Jone, W.-B., Chakrabarty, K., Sahinoglu, M.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 986 KB

english, 2003

32

An empirical Bayesian stopping rule in testing and verification of behavioral models

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 1.01 MB

english, 2003

33

A self-binning BIST structure for data communications transceivers

Lin, S.L., Krishnan, S., Mourad, S.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 894 KB

english, 2003

34

Single-clock, single-latch, scan design

Sheth, A.M., Savir, J.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 185 KB

english, 2003

35

Modeling, calibration, and rendition of color logarithmic CMOS image sensors

Joseph, D., Collins, S.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 457 KB

english, 2003

36

3-D acquisition and quantitative measurements of anatomical parts by optical scanning and image reconstruction from unorganized range data

Tognola, G., Parazzini, M., Ravazzani, P., Grandori, F., Svelto, C.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 786 KB

english, 2003

37

Performance evaluation of a fluid temperature-compensated single sensor constant temperature anemometer

Ferreira, R.P.C., Freire, R.C.S., Deep, G.S.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 347 KB

english, 2003

38

Designing a programmable analog signal conditioning circuit without loss of measurement range

Catunda, S.Y.C., Naviner, J.-F., Deep, G.S., Freire, R.C.S.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 368 KB

english, 2003

39

Management of measurement uncertainty for effective statistical process control

Macii, D., Carbone, P., Petri, D.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 410 KB

english, 2003

40

A Nasicon CO2 gas sensor with drift-detection electrode

Song Chen, De-Yin Jeng, Hadano, H., Ishiguro, Y., Nakayama, M., Watanabe, K.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 498 KB

english, 2003

41

Intrinsic sensitivity of Cd1-xZnxTe semiconductors for digital radiographic imaging

Giakos, G.C., Guntupalli, R., De Abreu-Garcia, J.A., Shah, N., Vedantham, S., Suryanarayanan, S., Chowdhury, S., Patnekar, N., Sumrain, S., Mehta, K., Evans, E., Orozco, A., Kumar, V., Ugweje, O., Moh

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 307 KB

english, 2003

42

Signal dispersion measurements on the gas detector volume of a dual-energy multimedia digital imaging sensor

Giakos, G.C., Chowdhury, S., Shah, N., Guntupalli, S., Vedantham, S., Suryanarayanan, S., Nemer, R., Dasgupta, A., Mehta, K., Evans, E., Orozco, A., Kumar, V., Fraiwan, L., Patnekar, N.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 341 KB

english, 2003

43

Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]

Das, S.R., Rajsuman, R.

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2003

Language:

english

File:

PDF, 205 KB

english, 2003

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