Optimization strategies for parametric analysis of...

IEEE Transactions on Instrumentation and Measurement 2003 Vol. 52; Iss. 5

Optimization strategies for parametric analysis of thin-film reflectivity spectra

Schlaf, M., Hagras, H., Sands, D.
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Volume:
52
Year:
2003
Language:
english
Pages:
5
DOI:
10.1109/tim.2003.817921
File:
PDF, 227 KB
english, 2003
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