Test limitations of parametric faults in analog circuits

IEEE Transactions on Instrumentation and Measurement 2003 Vol. 52; Iss. 5

Test limitations of parametric faults in analog circuits

Savir, J., Zhen Guo
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Volume:
52
Year:
2003
Language:
english
Pages:
11
DOI:
10.1109/tim.2003.818541
File:
PDF, 483 KB
english, 2003
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