An efficient BIST method for non-traditional faults of...

IEEE Transactions on Instrumentation and Measurement 2003 Vol. 52; Iss. 5

An efficient BIST method for non-traditional faults of embedded memory arrays

Jone, W.-B., Der-Chen Huang, Das, S.R.
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Volume:
52
Year:
2003
Language:
english
Pages:
10
DOI:
10.1109/tim.2003.818546
File:
PDF, 412 KB
english, 2003
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