Parity bit signature in response data compaction and...

IEEE Transactions on Instrumentation and Measurement 2003 Vol. 52; Iss. 5

Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets

Das, S.R., Sudarma, M., Assaf, M.H., Petriu, E.M., Jone, W.-B., Chakrabarty, K., Sahinoglu, M.
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Volume:
52
Year:
2003
Language:
english
Pages:
18
DOI:
10.1109/tim.2003.818547
File:
PDF, 986 KB
english, 2003
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