Testing of Precision DAC Using Low-Resolution ADC With...

IEEE Transactions on Instrumentation and Measurement 2008 Vol. 57; Iss. 5

Testing of Precision DAC Using Low-Resolution ADC With Wobbling

Le Jin, Haggag, H., Geiger, R.L., Degang Chen
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Volume:
57
Year:
2008
Language:
english
Pages:
7
DOI:
10.1109/tim.2007.911694
File:
PDF, 277 KB
english, 2008
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