Volume 57; Issue 5

1

Decomposition of Currents in Three- and Four-Wire Systems

Year:
2008
Language:
english
File:
PDF, 298 KB
english, 2008
8

Low-Cost Scan Test for IEEE-1500-Based SoC

Year:
2008
Language:
english
File:
PDF, 951 KB
english, 2008
9

Petri Nets in Measuring Systems Design

Year:
2008
Language:
english
File:
PDF, 453 KB
english, 2008
11

BER Testing of Communication Interfaces

Year:
2008
Language:
english
File:
PDF, 745 KB
english, 2008
18

Grounded Inductor Simulators With Improved Low-Frequency Performances

Year:
2008
Language:
english
File:
PDF, 575 KB
english, 2008
26

Table of contents

Year:
2008
Language:
english
File:
PDF, 37 KB
english, 2008
27

IEEE Transactions on Instrumentation and Measurement publication information

Year:
2008
Language:
english
File:
PDF, 48 KB
english, 2008
28

IEEE Instrumentation and Measurement Society Information

Year:
2008
Language:
english
File:
PDF, 32 KB
english, 2008