Simulation of the local effect of nuclear particles on...

Russian Microelectronics 2012 / 07 Vol. 41; Iss. 4

Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells

Stenin, V. Ya., Stepanov, P. V.
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Volume:
41
Language:
english
Pages:
8
Journal:
Russian Microelectronics
DOI:
10.1134/s1063739712040117
Date:
July, 2012
File:
PDF, 246 KB
english, 2012
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