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Volume 41; Issue 4
Main
Russian Microelectronics
Volume 41; Issue 4
Russian Microelectronics
Volume 41; Issue 4
1
An estimate of the FPGA sensitivity to effects of single nuclear particles
Bobrovskii, D. V.
,
Kalashnikov, O. A.
,
Nekrasov, P. V.
Journal:
Russian Microelectronics
Year:
2012
Language:
english
File:
PDF, 162 KB
Your tags:
english, 2012
2
Radiation-induced degradation in the dynamic parameters of memory chips
Boruzdina, A. B.
,
Ulanova, A. V.
,
Grigor’ev, N. G.
,
Nikiforov, A. Yu.
Journal:
Russian Microelectronics
Year:
2012
Language:
english
File:
PDF, 358 KB
Your tags:
english, 2012
3
Single-event-effect sensetivity characterization of LSI circuits with a laser-based and a pulsed gamma-ray testing facilities used in combination
Chumakov, A. I.
,
Vasil’ev, A. L.
,
Pechenkin, A. A.
,
Savchenkov, D. V.
,
Tararaksin, A. S.
,
Yanenko, A. V.
Journal:
Russian Microelectronics
Year:
2012
Language:
english
File:
PDF, 311 KB
Your tags:
english, 2012
4
Investigation of the possibility to develop radiation-hardness LSIs for navigational purposes according to the 0.35-μm domestic CMOS SOI technology
Elesin, V. V.
,
Nazarova, G. N.
,
Chukov, G. V.
,
Kabal’nov, Yu. A.
,
Titarenko, A. A.
Journal:
Russian Microelectronics
Year:
2012
Language:
english
File:
PDF, 647 KB
Your tags:
english, 2012
5
An analysis of the radiation behavior of pulse voltage stabilizers
Kessarinskiy, L. N.
,
Boychenko, D. V.
,
Nikiforov, A. Y.
Journal:
Russian Microelectronics
Year:
2012
Language:
english
File:
PDF, 492 KB
Your tags:
english, 2012
6
Simulation of the local effect of nuclear particles on 65-nm CMOS elements of two-phase logics
Katunin, Yu. V.
,
Stenin, V. Ya.
Journal:
Russian Microelectronics
Year:
2012
Language:
english
File:
PDF, 308 KB
Your tags:
english, 2012
7
Electron transport in thin-base transistor structures exposed to high-energy photons
Puzanov, A. S.
,
Obolensky, S. V.
Journal:
Russian Microelectronics
Year:
2012
Language:
english
File:
PDF, 275 KB
Your tags:
english, 2012
8
Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells
Stenin, V. Ya.
,
Stepanov, P. V.
Journal:
Russian Microelectronics
Year:
2012
Language:
english
File:
PDF, 246 KB
Your tags:
english, 2012
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