Multiple-Bit Upset in 130 nm CMOS Technology

IEEE Transactions on Nuclear Science 2006 Vol. 53; Iss. 6

Multiple-Bit Upset in 130 nm CMOS Technology

Tipton, Alan D., Pellish, Jonathan A., Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Mendenhall, Marcus H., Sierawski, Brian, Sutton, Akil K., Diestelhorst, Ryan M., Espinel, Gustavo
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Volume:
53
Year:
2006
Language:
english
Pages:
6
DOI:
10.1109/tns.2006.884789
File:
PDF, 482 KB
english, 2006
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