Volume 53; Issue 6

IEEE Transactions on Nuclear Science

Volume 53; Issue 6

1

Modeling Single-Event Upsets in 65-nm Silicon-on-Insulator Semiconductor Devices

KleinOsowski, AJ, Oldiges, Phil, Williams, Richard Q., Solomon, Paul M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 596 KB

english, 2006

2

Multiple-Bit Upset in 130 nm CMOS Technology

Tipton, Alan D., Pellish, Jonathan A., Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Mendenhall, Marcus H., Sierawski, Brian, Sutton, Akil K., Diestelhorst, Ryan M., Espinel, Gustavo

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 482 KB

english, 2006

3

Design and Performance of a Thermal Neutron Imaging Facility at the North Carolina State University PULSTAR Reactor

Mishra, Kaushal K., Hawari, Ayman I., Gillette, Victor H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 2.09 MB

english, 2006

4

Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells

Heidel, David F., Rodbell, Kenneth P., Oldiges, Phil, Gordon, Michael S., Tang, Henry H. K., Cannon, Ethan H., Plettner, Cristina

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 291 KB

english, 2006

5

Boxes: An Engineering Methodology for Calculating Soft Error Rates in SOI Integrated Circuits

Fulkerson, David E., Nelson, David K., Carlson, Roy M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 403 KB

english, 2006

6

Analysis of Single Events Effects on Monolithic PLL Frequency Synthesizers

Chung, Hoon Hee, Chen, Wenjian, Bakkaloglu, Bertan, Barnaby, Hugh J., Vermeire, Bert, Kiaei, Sayfe

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 522 KB

english, 2006

7

Effects of Water on the Aging and Radiation Response of MOS Devices

Batyrev, I. G., Rodgers, M. P., Fleetwood, D. M., Schrimpf, R. D., Pantelides, S. T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.30 MB

english, 2006

8

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Amusan, Oluwole A., Witulski, Arthur F., Massengill, Lloyd W., Bhuva, Bharat L., Fleming, Patrick R., Alles, Michael L., Sternberg, Andrew L., Black, Jeffrey D., Schrimpf, Ronald D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 978 KB

english, 2006

9

Single-Event Tolerant Latch Using Cascode-Voltage Switch Logic Gates

Casey, Megan C., Bhuva, Bharat L., Black, Jeff D., Massengill, Lloyd W., Amusan, Oluwole A., Witulski, Arthur F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 192 KB

english, 2006

10

Total-Ionizing-Dose Effects in Modern CMOS Technologies

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.48 MB

english, 2006

11

Single-Event Transients in Bipolar Linear Integrated Circuits

Buchner, Stephen, McMorrow, Dale

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.13 MB

english, 2006

12

Single-Event Burnout and Avalanche Characteristics of Power DMOSFETs

Liu, Sandra, Boden, Milton, Girdhar, Dev Alok, Titus, Jeffrey L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 396 KB

english, 2006

13

Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser Testing

Miller, F., Luu, A., Prud'homme, F., Poirot, P., Gaillard, R., Buard, N., Carrire, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.57 MB

english, 2006

14

A Statistical Technique to Measure the Proportion of MBU's in SEE Testing

Chugg, A. M., Moutrie, M. J., Burnell, A. J., Jones, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 275 KB

english, 2006

15

Proton and Heavy Ion Irradiation Effects on AlGaN/GaN HFET Devices

Sonia, G., Brunner, F., Denker, A., Lossy, R., Mai, M., Opitz-Coutureau, J., Pensl, G., Richter, E., Schmidt, J., Zeimer, U., Wang, L., Weyers, M., Wrfl, J., Trnkle, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 269 KB

english, 2006

16

Radiation Hardened by Design RF Circuits Implemented in 0.13 $\mu$m CMOS Technology

Chen, W., Pouget, V., Gentry, G. K., Barnaby, H. J., Vermeire, B., Bakkaloglu, B., Kiaei, S., Holbert, K. E., Fouillat, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 626 KB

english, 2006

17

A Hardened-by-Design Technique for RF Digital Phase-Locked Loops

Loveless, T. D., Massengill, L. W., Bhuva, B. L., Holman, W. T., Witulski, A. F., Boulghassoul, Y.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 224 KB

english, 2006

18

Electron-Induced Displacement Damage Effects in CCDs

Becker, Heidi N., Elliott, Tom, Alexander, James W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 609 KB

english, 2006

19

Alpha-Induced Multiple Cell Upsets in Standard and Radiation Hardened SRAMs Manufactured in a 65 nm CMOS Technology

Gasiot, G., Giot, D., Roche, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1014 KB

english, 2006

20

An SEU-Robust Configurable Logic Block for the Implementation of a Radiation-Tolerant FPGA

Bonacini, Sandro, Faccio, Federico, Kloukinas, Kostas, Marchioro, Alessandro

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.42 MB

english, 2006

21

Cobalt Therapy Dosimetric Calculations Over a Voxelized Heterogeneous Phantom: Validation of Different Monte Carlo Models and Methodologies Against Experimental Data

Mir, R., Juste, B., Gallardo, S., Santos, A., Verd, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 941 KB

english, 2006

22

Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic Circuits

Krithivasan, Ramkumar, Marshall, Paul W., Nayeem, Mustayeen, Sutton, Akil K., Kuo, Wei-Min, Haugerud, Becca M., Najafizadeh, Laleh, Cressler, John D., Carts, Martin A., Marshall, Cheryl J., Hansen, Da

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.01 MB

english, 2006

23

Crosstalk Effects Caused by Single Event Hits in Deep Sub-Micron CMOS Technologies

Balasubramanian, A., Sternberg, A. L., Bhuva, B. L., Massengill, L. W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 735 KB

english, 2006

24

Simultaneous Evaluation of TID and Displacement Damage Dose Using a Single OSL Sensor

Garcia, P., Vaill, J.-R., Benoit, D., Chabane, H., Berger, G., Idri, K., Boch, J., Sagnes, B., Saign, F., Lorfvre, E., Bezerra, F., Dusseau, L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 283 KB

english, 2006

25

Digital Single Event Transient Trends With Technology Node Scaling

Benedetto, J. M., Eaton, P. H., Mavis, D. G., Gadlage, M., Turflinger, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 135 KB

english, 2006

26

CCD Radiation Testing at Low Temperatures Using a Laboratory Alpha Particle Source

Hopkinson, Gordon R., Mohammadzadeh, Ali

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 431 KB

english, 2006

27

Implications of Nuclear Reactions for Single Event Effects Test Methods and Analysis

Reed, Robert A., Weller, Robert A., Schrimpf, Ronald D., Mendenhall, Marcus H., Warren, Kevin M., Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 494 KB

english, 2006

28

Evaluation of Semiinsulating Annealed InP:Ta for Radiation Detectors

Zdansky, Karel, Gorodynskyy, Vladyslav, Pekarek, Ladislav, Kozak, Halyna

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 188 KB

english, 2006

29

Total Ionizing Dose Effects on Triple-Gate FETs

Gaillardin, M., Paillet, P., Ferlet-Cavrois, V., Faynot, O., Jahan, C., Cristoloveanu, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1008 KB

english, 2006

30

Physical Model for the Low-Dose-Rate Effect in Bipolar Devices

Boch, J., Saign, F., Schrimpf, R. D., Vaill, J.-R., Dusseau, L., Lorfvre, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 269 KB

english, 2006

31

Radiation Response and Variability of Advanced Commercial Foundry Technologies

Felix, James A., Dodd, Paul E., Shaneyfelt, Marty R., Schwank, James R., Hash, Gerald L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 420 KB

english, 2006

32

Ionizing Radiation Effects in Single-Crystal and Polycrystalline YAG

Vaddigiri, A., Simmons Potter, K., Thomes, W. J., Meister, D. C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 659 KB

english, 2006

33

SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

Oldham, T. R., Ladbury, R. L., Friendlich, M., Kim, H. S., Berg, M. D., Irwin, T. L., Seidleck, C., LaBel, K. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 172 KB

english, 2006

34

Application of Imaging Systems to Characterization of Single-Event Effects in High-Energy Neutron Environments

Trk, Z., Platt, S. P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 507 KB

english, 2006

35

Digital Device Error Rate Trends in Advanced CMOS Technologies

Gadlage, Matthew J., Eaton, Paul H., Benedetto, Joseph M., Carts, Marty, Zhu, Vivian, Turflinger, Thomas L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 211 KB

english, 2006

36

An Area and Power Efficient Radiation Hardened by Design Flip-Flop

Knudsen, Jonathan E., Clark, Lawrence T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 659 KB

english, 2006

37

Study of the Broad Emission Wavelength of Lu $_{0.4}$Gd$_{1.6}$ SiO$_5$:Ce for APD Detection

Shimizu, S., Murakami, H., Koizumi, T., Usui, T., Shimura, N., Kurashige, K., Kurata, Y., Senguttuvan, N., Sumiya, K., Ishibashi, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 283 KB

english, 2006

38

Single-Event Transients in Voltage Regulators

Johnston, A. H., Miyahira, T. F., Irom, F., Laird, J. S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 173 KB

english, 2006

39

Effects of Angle of Incidence on Proton and Neutron-Induced Single-Event Latchup

Schwank, J. R., Shaneyfelt, M. R., Baggio, J., Dodd, P. E., Felix, J. A., Ferlet-Cavrois, V., Paillet, P., Lum, G. K., Girard, S., Blackmore, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 753 KB

english, 2006

40

X-Ray Irradiation and Bias Effects in Fully-Depleted and Partially-Depleted SiGe HBTs Fabricated on CMOS-Compatible SOI

Bellini, Marco, Jun, Bongim, Chen, Tianbing, Cressler, John D., Marshall, Paul W., Chen, Dakai, Schrimpf, Ronald D., Fleetwood, Daniel M., Cai, Jin

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.18 MB

english, 2006

41

Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs

Ferlet-Cavrois, V., Paillet, P., Gaillardin, M., Lambert, D., Baggio, J., Schwank, J. R., Vizkelethy, G., Shaneyfelt, M. R., Hirose, K., Blackmore, E. W., Faynot, O., Jahan, C., Tosti, L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.20 MB

english, 2006

42

Modeling Total-Dose Effects for a Low-Dropout Voltage Regulator

Ramachandran, V., Narasimham, B., Fleetwood, D. M., Schrimpf, R. D., Holman, W. T., Witulski, A. F., Pease, R. L., Dunham, G. W., Seiler, J. E., Platteter, D. G.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.41 MB

english, 2006

43

Track-Based Alignment of Composite Detector Structures

Karimki, Veikko, Lampn, Tapio, Schilling, Frank-Peter

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 476 KB

english, 2006

44

Discrimination Between Different Types of Material in Track Reconstruction With a Gaussian-Sum Filter

Strandlie, Are, Frhwirth, Rudolf

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 383 KB

english, 2006

45

A Framework for Understanding Displacement Damage Mechanisms in Irradiated Silicon Devices

Srour, J. R., Palko, J. W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 584 KB

english, 2006

46

A TID and SEE Radiation-Hardened, Wideband, Low-Noise Amplifier

Mossawir, Benjamin, Linscott, Ivan R., Inan, Umran S., Roeder, James L., Osborn, Jon V., Witczak, Steven C., King, Everett E., LaLumondiere, Stephen D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.89 MB

english, 2006

47

Distributed Analysis Jobs With the Atlas Production System

Gonzlez, Santiago, Liko, Dietrich, Nairz, Armin, Mair, Gregor, Orellana, Frederik, Goossens, Luc, Resconi, Silvia, de Salvo, Alessandro

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 556 KB

english, 2006

48

Application of a Digital Technique for Timing of Events From Scintillation Detectors

Abbiati, Roberto, Geraci, Angelo, Gatti, Emilio, Ripamonti, Giancarlo

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 390 KB

english, 2006

49

Optimum Digital Filters for Baseline Restoration

Xiangyang, Wen, Yixiang, Wei

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 174 KB

english, 2006

50

A Novel Scatter Detector for High-Resolution SPECT Imaging With Compton Telescopes

Castoldi, A., Galimberti, A., Guazzoni, C., Strder, L., Walenta, A. H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 881 KB

english, 2006

51

Evaluation of the Radiation Tolerance of SiGe Heterojunction Bipolar Transistors Under 24-GeV Proton Exposure

Metcalfe, J., Dorfan, D. E., Grillo, A. A., Jones, A., Lucia, D., Martinez-McKinney, F., Mendoza, M., Rogers, M., Sadrozinski, H. F.-W., Seiden, A., Spencer, E., Wilder, M., Cressler, J. D., Prakash,

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 204 KB

english, 2006

52

New Developments of the Goodness-of-Fit Statistical Toolkit

Mascialino, Barbara, Pfeiffer, Andreas, Pia, Maria Grazia, Ribon, Alberto, Viarengo, Paolo

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 410 KB

english, 2006

53

Cryogenic Behavior of Optoelectronic Devices for the Transmission of Analog Signals Via Fiber Optics

Camin, Daniel V., Grassi, Valerio

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 397 KB

english, 2006

54

Comparison of Above Bandgap Laser and MeV Ion Induced Single Event Transients in High-Speed Si Photonic Devices

Laird, Jamie S., Hirao, Toshio, Onoda, Shinobu, Itoh, Hisayoshi, Johnston, Allan

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.34 MB

english, 2006

55

A Semi-empirical Approach for Heavy Ion SEU Cross Section Calculations

Wrobel, Frdric, Hubert, Guillaume, Iacconi, Philibert

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 658 KB

english, 2006

56

Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation Technologies

Pellish, Jonathan A., Reed, Robert A., Schrimpf, Ronald D., Alles, Michael L., Varadharajaperumal, Muthubalan, Niu, Guofu, Sutton, Akil K., Diestelhorst, Ryan M., Espinel, Gustavo, Krithivasan, Ramkum

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 706 KB

english, 2006

57

Reduced Charge Diffusion in Thick, Fully Depleted CCDs With Enhanced Red Sensitivity

Fairfield, Jessamyn A., Groom, Donald E., Bailey, Stephen J., Bebek, Christopher J., Holland, Stephen E., Karcher, Armin, Koble, William F., Lorenzon, Wolfgang, Roe, Natalie A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 612 KB

english, 2006

58

Quality Control Studies of Wavelength Shifting Fibers for a Scintillator-Based Tail Catcher Muon Tracker for Linear Collider Prototype Detector

Dyshkant, A., Beznosko, D., Blazey, G., Fisk, E., Hahn, E., Rykalin, V., Wayne, M., Zutshi, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.10 MB

english, 2006

59

Comparison of a LaBr$_{3}$ (Ce) Scintillation Detector With a Large Volume CdZnTe Detector

Syntfeld, Agnieszka, Arlt, Rolf, Gostilo, Vladimir, Loupilov, Alexander, Moszyski, Marek, Nassalski, Antoni, Swoboda, Martha, Wolski, Dariusz

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 316 KB

english, 2006

60

Implications of Characterization Temperature on Hardness Assurance Qualification

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Hash, Gerald L., Paillet, Philippe, Felix, James A., Baggio, Jacques, Ferlet-Cavrois, Veronique

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 272 KB

english, 2006

61

The Effect of Negative Feedback on Single Event Transient Propagation in Digital Circuits

Narasimham, Balaji, Bhuva, Bharat L., Holman, William T., Schrimpf, Ronald D., Massengill, Lloyd W., Witulski, Arthur F., Robinson, William H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 243 KB

english, 2006

62

SEUs Induced by Thermal to High-Energy Neutrons in SRAMs

Granlund, Thomas, Olsson, Nils

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 349 KB

english, 2006

63

Simple Calculations of Proton SEU Cross Sections from Heavy Ion Cross Sections

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 267 KB

english, 2006

64

14-MeV Neutron, $\gamma$-Ray, and Pulsed X-Ray Radiation-Induced Effects on Multimode Silica-Based Optical Fibers

Girard, S., Baggio, J., Bisutti, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 771 KB

english, 2006

65

Radiation Dose Effects in Trigate SOI MOS Transistors

Colinge, J. P., Orozco, A., Rudee, J., Xiong, Weize, Cleavelin, C. Rinn, Schulz, T., Schrfer, K., Knoblinger, G., Patruno, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.27 MB

english, 2006

66

Silicon Microdosimetry in Heterogeneous Materials: Simulation and Experiment

Wroe, A., Rosenfeld, A., Cornelius, I., Prokopovich, D., Reinhard, M., Schulte, R., Bashkirov, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.21 MB

english, 2006

67

SEL Induced Latent Damage, Testing, and Evaluation

Layton, Phil, Kniffin, Scott, Guertin, Steven, Swift, Gary, Buchner, Stephen

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.74 MB

english, 2006

68

Variability in FG Memories Performance After Irradiation

Cellere, Giorgio, Paccagnella, A., Visconti, Angelo, Bonanomi, Mauro

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 364 KB

english, 2006

69

The Effects of Irradiation Temperature on the Proton Response of SiGe HBTs

Prakash, A. P. Gnana, Sutton, Akil K., Diestelhorst, Ryan M., Espinel, Gustavo, Andrews, Joel, Jun, Bongim, Cressler, John D., Marshall, Paul W., Marshall, Cheryl J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.49 MB

english, 2006

70

Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS Devices

Jun, Bongim, Diestelhorst, Ryan M., Bellini, Marco, Espinel, Gustavo, Appaswamy, Aravind, Prakash, A. P. Gnana, Cressler, John D., Chen, Dakai, Schrimpf, Ronald D., Fleetwood, Daniel M., Turowski, Mar

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 670 KB

english, 2006

71

Continuous Time-Charge Amplification and Shaping in CMOS Monolithic Sensors for Particle Tracking

Ratti, Lodovico

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 501 KB

english, 2006

72

Analysis of Bias Effects on the Total-Dose Response of a Bipolar Voltage Comparator

Bernard, M. F., Dusseau, L., Boch, J., Vaill, J-R., Saign, F., Schrimpf, R. D., Lorfvre, E., David, J. P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 645 KB

english, 2006

73

Secondary Effects of Single Ions on Floating Gate Memory Cells

Cellere, G., Paccagnella, A., Visconti, A., Bonanomi, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 309 KB

english, 2006

74

Proton Tolerance of SiGe Precision Voltage References for Extreme Temperature Range Electronics

Najafizadeh, Laleh, Bellini, Marco, Prakash, A. P. Gnana, Espinel, Gustavo A., Cressler, John D., Marshall, Paul W., Marshall, Cheryl J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 352 KB

english, 2006

75

Performance of a Fast Binary Readout CMOS Active Pixel Sensor Chip Designed for Charged Particle Detection

Deerli, Yavuz, Besanon, Marc, Besson, Auguste, Claus, Gilles, Deptuch, Grzegorz, Dulinski, Wojciech, Fourches, Nicolas, Goffe, Mathieu, Himmi, Abdelkader, Li, Yan, Lutz, Pierre, Orsini, Fabienne, Szel

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.99 MB

english, 2006

76

Investigation of Quantum Effects in Ultra-Thin Body Single- and Double-Gate Devices Submitted to Heavy Ion Irradiation

Munteanu, D., Ferlet-Cavrois, V., Autran, J. L., Paillet, P., Baggio, J., Faynot, O., Jahan, C., Tosti, L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 527 KB

english, 2006

77

Bulk Scheduling With the DIANA Scheduler

Anjum, Ashiq, McClatchey, Richard, Ali, Arshad, Willers, Ian

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 778 KB

english, 2006

78

The Influence of High-Energy Lithium Ion Irradiation on Electrical Characteristics of Silicon and GaAs Solar Cells

Jayashree, B., Ramani,, Radhakrishna, M. C., Agrawal, Anil, Khan, Saif Ahmad, Meulenberg, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 287 KB

english, 2006

79

Anomalous Charge Collection in Silicon Carbide Schottky Barrier Diodes and Resulting Permanent Damage and Single-Event Burnout

Kuboyama, Satoshi, Kamezawa, Chihiro, Ikeda, Naomi, Hirao, Toshio, Ohyama, Hidenori

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 468 KB

english, 2006

80

Time-Domain Component Analysis of Heavy-Ion-Induced Transient Currents in Fully-Depleted SOI MOSFETs

Kobayashi, Daisuke, Aimi, Masahiro, Saito, Hirobumi, Hirose, Kazuyuki

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 421 KB

english, 2006

81

Effect of Omnidirectional Proton Irradiation On Shielded Solar Cells

Messenger, Scott R., Burke, Edward A., Walters, Robert J., Warner, Jeffrey H., Summers, Geoffrey P., Morton, Thomas L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 824 KB

english, 2006

82

An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTs

Sutton, Akil K., Gnana Prakash, A. P., Jun, Bongim, Zhao, Enhai, Bellini, Marco, Pellish, Jonathan, Diestelhorst, Ryan M., Carts, Martin A., Phan, Anthony, Ladbury, Ray, Cressler, John D., Marshall, P

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.46 MB

english, 2006

83

Effects of Gamma and Heavy Ion Damage on the Impulse Response and Pulsed Gain of a Low Breakdown Voltage Si Avalanche Photodiode

Laird, Jamie S., Onoda, Shinobu, Hirao, Toshio, Becker, Heidi, Johnston, Allan, Itoh, Hisayoshi

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 938 KB

english, 2006

84

Analysis of 45-nm Multi-Gate Transistors Behavior Under Heavy Ion Irradiation by 3-D Device Simulation

Castellani-Couli, K., Munteanu, D., Autran, J. L., Ferlet-Cavrois, V., Paillet, P., Baggio, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.00 MB

english, 2006

85

Measurements and Simulations of Spatial Distribution Change of Ions Surrounding an Alpha Source With Temperature, Humidity and Airflow Using a Position-Sensitive Micro-Ionization Chamber

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 401 KB

english, 2006

86

Impact of Heavy-Ion Strikes on Nanocrystal Non Volatile Memory Cell Arrays

Cester, Andrea, Gasperin, Alberto, Wrachien, Nicola, Paccagnella, Alessandro, Ancarani, Valentina, Gerardi, Cosimo

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 316 KB

english, 2006

87

Reducing Soft Error Rate in Logic Circuits Through Approximate Logic Functions

Sierawski, Brian D., Bhuva, Bharat L., Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 167 KB

english, 2006

88

Optimization for SEU/SET Immunity on 0.15 $\mu$m Fully Depleted CMOS/SOI Digital Logic Devices

Makihara, A., Yamaguchi, T., Asai, H., Tsuchiya, Y., Amano, Y., Midorikawa, M., Shindou, H., Onoda, S., Hirao, T., Nakajima, Y., Takahashi, T., Ohnishi, K., Kuboyama, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 326 KB

english, 2006

89

Measurement of the Energy Depositions in a Silicon Volume by 14 MeV Neutrons

Chabane, H., Vaill, J. R., Barelaud, B., Wrobel, F., Calzavara, Y., McNulty, P. J., Decossas, J. L., Garcia, P., Dusseau, L., Boch, J., Saign, F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 275 KB

english, 2006

90

Radiation Characterization of a Hardened 0.22 $\mu$m Anti-Fuse Field Programmable Gate Array

Nejad, R. J., Rickey, P. A., Konadu, K., Stapor, W. J., McDonald, P. T., Heidergott, W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.02 MB

english, 2006

91

Total Dose Radiation Response of Nitrided and Non-nitrided SiO$_{2}$/4H-SiC MOS Capacitors

Dixit, Sriram K., Dhar, Sarit, Rozen, John, Wang, Sanwu, Schrimpf, Ronald D., Fleetwood, Daniel M., Pantelides, Sokrates T., Williams, John. R., Feldman, Leonard C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 516 KB

english, 2006

92

Microdosimetric GEANT4 and FLUKA Monte Carlo Simulations and Measurements of Heavy Ion Irradiation of Silicon and Tissue

Beck, P., Wind, M., Rollet, S., Latocha, M., Bock, F., Bck, H., Uchihori, Y.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.94 MB

english, 2006

93

Direct Measurement of SET Pulse Widths in 0.2- $\mu$m SOI Logic Cells Irradiated by Heavy Ions

Yanagawa, Y., Hirose, K., Saito, H., Kobayashi, D., Fukuda, S., Ishii, S., Takahashi, D., Yamamoto, K., Kuroda, Y.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 369 KB

english, 2006

94

SEU Cross Sections of Hardened and Unhardened SiGe Circuits

Hansen, D. L., Chu, P., Jobe, K., McKay, A. L., Warren, H. P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 226 KB

english, 2006

95

Quantifying the Double-Sided Neutron SEU Threat, From Low Energy (Thermal) and High Energy ( ${>}10$ MeV) Neutrons

Normand, E., Vranish, K., Sheets, A., Stitt, M., Kim, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 669 KB

english, 2006

96

Monte Carlo Simulation of Proton Upsets in Xilinx Virtex-II FPGA Using a Position Dependent ${\rm Q}_{\rm crit}$ With PROPSET

Foster, Charles C., O'Neill, Patrick M., Kouba, Coy K.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 427 KB

english, 2006

97

Limiting Upset Cross Sections of SEU Hardened SOI SRAMs

Liu, Michael S., Liu, Harry Y., Brewster, Nancy, Nelson, Dave, Golke, Keith W., Kirchner, Gary, Hughes, Harold L., Campbell, Arthur, Ziegler, James F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.10 MB

english, 2006

98

Neutron-Induced Single Event Effects Testing Across a Wide Range of Energies and Facilities and Implications for Standards

Dyer, Clive, Hands, Alex, Ford, Karen, Frydland, Adam, Truscott, Peter

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 767 KB

english, 2006

99

Proton Induced Single Event Upset in 6 T SOI SRAMs

Liu, Harry Y., Liu, Michael S., Hughes, Harold L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 270 KB

english, 2006

100

Light Particle-Induced Single Event Degradation in SDRAMs

David, J.-P., Bezerra, F., Lorfvre, E., Nuns, T., Inguimbert, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 244 KB

english, 2006

101

Single Event-Induced Error Propagation Through Nominally-off Transmission Gates

Hutson, J. M., Ramachandran, V., Bhuva, B. L., Zhu, X., Schrimpf, R. D., Amusan, O. A., Massengill, L. M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 223 KB

english, 2006

102

Microdose Induced Data Loss on Floating Gate Memories

Guertin, Steven M., Nguyen, Duc N., Patterson, Jeffrey D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 505 KB

english, 2006

103

Single-Event Upset and Scaling Trends in New Generation of the Commercial SOI PowerPC Microprocessors

Irom, Farokh, Farmanesh, Farhad, Kouba, Coy K.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 223 KB

english, 2006

104

Atomic-Scale Mechanisms for Low-NIEL Dopant-Type Dependent Damage in Si

Beck, M. J., Tsetseris, L., Caussanel, M., Schrimpf, R. D., Fleetwood, D. M., Pantelides, S. T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 319 KB

english, 2006

105

Effects of Switched-bias Annealing on Charge Trapping in HfO$_{2}$ Gate Dielectrics

Zhou, X. J., Fleetwood, D. M., Tsetseris, L., Schrimpf, R. D., Pantelides, S. T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 303 KB

english, 2006

106

An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays

Berg, Melanie, Wang, Jih-Jong, Ladbury, Ray, Buchner, Steve, Kim, Hak, Howard, Jim, LaBel, Ken, Phan, Anthony, Irwin, Tim, Friendlich, Mark

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 398 KB

english, 2006

107

Single Event-Induced Instability in Linear Voltage Regulators

Adell, P. C., Witulski, A. F., Schrimpf, R. D., Marec, R., Pouget, V., Calvel, P., Bezerra, F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.64 MB

english, 2006

108

Hybrid Fault Detection Technique: A Case Study on Virtex-II Pro's PowerPC 405

Bernardi, P., Sterpone, L., Violante, M., Portela-Garcia, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 175 KB

english, 2006

109

High-Vacuum Gamma Irradiation Facilities for Synergistic Effects Testing on Optoelectronic Components and Materials

Fernandez, A. Fernandez, Brichard, B., Ooms, H., Berghmans, F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.44 MB

english, 2006

110

Digital Control of a Bank of IIR Filters in Optimal Processing of Signals From Pulse Radiation Detectors

aponji, Djordje, Arandjelovi, Vojislav, Stoji, Mili

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 763 KB

english, 2006

111

Detailed Comparison of Monte Carlo and Sector-Shielding Analyses for Space Applications

Lindberg, R., Santin, G., Evans, H., Daly, E., Nieminen, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 709 KB

english, 2006

112

Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate Irradiation

Chen, X. J., Barnaby, H. J., Schrimpf, R. D., Fleetwood, D. M., Pease, R. L., Platteter, D. G., Dunham, G. W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 597 KB

english, 2006

113

Damage Equivalence of Heavy Ions in Silicon Bipolar Junction Transistors

Bielejec, E., Vizkelethy, G., Kolb, N. R., King, D. B., Doyle, B. L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 715 KB

english, 2006

114

Transient Currents Generated by Heavy Ions With Hundreds of MeV

Onoda, S., Hirao, T., Laird, J. S., Mishima, K., Kawano, K., Itoh, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 923 KB

english, 2006

115

Single-Event Sensitivity and Hardening of a Pipelined Analog-to-Digital Converter

Sternberg, A. L., Massengill, L. W., Hale, M., Blalock, B.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 266 KB

english, 2006

116

Interaction of Charged Spacecraft with Electric Propulsion Plume: On Orbit Data and Ground Test Results

Likar, Justin J., Bogorad, Alexander L., Malko, Thomas R., Goodzeit, Neil E., Galofaro, Joel T., Mandell, Myron J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 653 KB

english, 2006

117

Electrostatic Discharge Induced Momentum Impulse From Charged Spacecraft Surfaces

Bogorad, Alexander L., Likar, Justin J., Voorhees, Carl R., Herschitz, Roman

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 326 KB

english, 2006

118

New Partition Factor Calculations for Evaluating the Damage of Low Energy Ions in Silicon

Akkerman, A., Barak, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 373 KB

english, 2006

119

Differences Between Charge Trapping States in Irradiated Nano-Crystalline HfO$_{2}$ and Non-Crystalline Hf Silicates

Lucovsky, G., Fleetwood, D. M., Lee, S., Seo, H., Schrimpf, R. D., Felix, J. A., Lning, J., Fleming, L. B., Ulrich, M., Aspnes, D. E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 337 KB

english, 2006

120

SEU Error Signature Analysis of Gbit/s SiGe Logic Circuits Using a Pulsed Laser Microprobe

Sutton, Akil K., Krithivasan, Ramkumar, Marshall, Paul W., Carts, Martin A., Seidleck, Christina, Ladbury, Ray, Cressler, John D., Marshall, Cheryl J., Currie, Steve, Reed, Robert A., Niu, Guofu, Rand

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 717 KB

english, 2006

121

Impact of Heavy-Ion Strikes on Minimum-Size MOSFETs With Ultra-Thin Gate Oxide

Gerardin, Simone, Bagatin, Marta, Cester, Andrea, Paccagnella, Alessandro, Kaczer, Ben

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 208 KB

english, 2006

122

Propagating SET Characterization Technique for Digital CMOS Libraries

Baze, M. P., Wert, J., Clement, J. W., Hubert, M. G., Witulski, A., Amusan, O. A., Massengill, L., McMorrow, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 651 KB

english, 2006

123

The Effectiveness of TAG or Guard-Gates in SET Suppression Using Delay and Dual-Rail Configurations at 0.35 $\mu$ m

Shuler, R. L., Balasubramanian, A., Narasimham, B., Bhuva, B. L., O' Neill, P. M., Kouba, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 275 KB

english, 2006

124

Radiation-Induced Modifications of the Electrical Characteristics of Nanocrystal Memory Cells and Arrays

Gasperin, Alberto, Cester, Andrea, Wrachien, Nicola, Paccagnella, Alessandro, Ancarani, Valentina, Gerardi, Cosimo

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 386 KB

english, 2006

125

Editorial Conference Comments by the General Chairwoman

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 44 KB

english, 2006

126

Outstanding Conference Paper Award 2006 IEEE Nuclear and Space Radiation Effects Conference (NSREC)

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 971 KB

english, 2006

127

2006 Special NSREC Issue of the IEEE Transactions on Nuclear Science Comments by the Guest Editor

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 25 KB

english, 2006

128

Obituary: Scott Kniffin

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 98 KB

english, 2006

129

2006 December Special NSREC Issue of the IEEE Transactions on Nuclear Science List of Reviewers

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 23 KB

english, 2006

130

Mike Maher, In Memoriam

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 110 KB

english, 2006

131

2006 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 35 KB

english, 2006

132

IEEE Transactions on Nuclear Science Information for authors

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 30 KB

english, 2006

133

IEEE Transactions on Nuclear Science Information for authors

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 30 KB

english, 2006

134

2006 Index [Revised]

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 2.15 MB

english, 2006

135

Table of contents

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 72 KB

english, 2006

136

Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 17 KB

english, 2006

137

IEEE Transactions on Nuclear Science publication information

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 37 KB

english, 2006

138

IEEE Transactions on Nuclear Science publication information

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 37 KB

english, 2006

139

Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 17 KB

english, 2006

140

2006 Index

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.10 MB

english, 2006

141

Table of contents

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 103 KB

english, 2006

142

Conference Author Index

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 30 KB

english, 2006

143

Have you visited lately? www.ieee.org [advertisement]

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

File:

PDF, 221 KB

2006

144

[Front cover]

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

File:

PDF, 55 KB

2006