Enhanced MOS 1/f noise due to near-interfacial oxygen...

Journal of Non-Crystalline Solids 1995 Vol. 187; Iss. none

Enhanced MOS 1/f noise due to near-interfacial oxygen deficiency

D.M. Fleetwood, W.L. Warren, M.R. Shaneyfelt, R.A.B. Devine, John H. Scofield
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Volume:
187
Year:
1995
Language:
english
Pages:
206
DOI:
10.1016/0022-3093(95)00138-7
File:
PDF, 483 KB
english, 1995
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