Investigation of grain boundaries in BaSi2 epitaxial films on Si(1 1 1) substrates using transmission electron microscopy and electron-beam-induced current technique
Masakazu Baba, Katsuaki Toh, Kaoru Toko, Noriyuki Saito, Noriko Yoshizawa, Karolin Jiptner, Takashi Sekiguchi, Kosuke O. Hara, Noritaka Usami, Takashi SuemasuVolume:
348
Year:
2012
Language:
english
DOI:
10.1016/j.jcrysgro.2012.03.044
File:
PDF, 1.32 MB
english, 2012