Hot hole stress induced leakage current (SILC) transient in...

Hot hole stress induced leakage current (SILC) transient in tunnel oxides

Tahui Wang, Nian-Kai Zous, Jia-Long Lai, Chimoon Huang
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Volume:
19
Year:
1998
Language:
english
DOI:
10.1109/55.728896
File:
PDF, 107 KB
english, 1998
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