Interface traps and Pb centers in oxidized (100) silicon...

Applied Physics Letters 1986 Vol. 49; Iss. 6

Interface traps and Pb centers in oxidized (100) silicon wafers

Gerardi, Gary J., Poindexter, Edward H., Caplan, Philip J., Johnson, Noble M.
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Volume:
49
Year:
1986
Language:
english
DOI:
10.1063/1.97611
File:
PDF, 429 KB
english, 1986
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