Identification and classification of single-event upsets in...

IEEE Transactions on Nuclear Science 2003 / 12 Vol. 50; Iss. 6

Identification and classification of single-event upsets in the configuration memory of sram-based fpgas

Ceschia, M., Violante, M., Reorda, M.S., Paccagnella, A., Bernardi, P., Rebaudengo, M., Bortolato, D., Bellato, M., Zambolin, P., Candelori, A.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821411
Date:
December, 2003
File:
PDF, 316 KB
english, 2003
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