Volume 50; Issue 6

IEEE Transactions on Nuclear Science

Volume 50; Issue 6

1

Total dose hardness assurance testing using laboratory radiation sources

Paillet, P., Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Jones, R.L., Flament, O., Blackmore, E.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 687 KB

english, 2003

2

Simulation study of single-event gate rupture using radiation-hardened stripe cell power mosfet structures

Titus, J.L., Yen-Sheng Su,, Savage, M.W., Mickevicius, R.V., Wheatley, C.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 634 KB

english, 2003

3

Accurate single-event-transient analysis via zero-delay logic simulation

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 262 KB

english, 2003

4

Accelerator validation of an fpga seu simulator

Johnson, E., Caffrey, M., Graham, P., Rollins, N., Wirthlin, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 1.34 MB

english, 2003

5

Identification and classification of single-event upsets in the configuration memory of sram-based fpgas

Ceschia, M., Violante, M., Reorda, M.S., Paccagnella, A., Bernardi, P., Rebaudengo, M., Bortolato, D., Bellato, M., Zambolin, P., Candelori, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 316 KB

english, 2003

6

Measurement of conductivity and charge storage in insulators related to spacecraft charging

Frederickson, A.R., Dennison, J.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 376 KB

english, 2003

7

Comparison of ccd damage due to 10- and 60-mev protons

Hopkinson, G.R., Mohammadzadeh, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 497 KB

english, 2003

8

LaBr/sub 3/:Ce scintillators for gamma-ray spectroscopy

Shah, K.S., Glodo, J., Klugerman, M., Moses, W.W., Derenzo, S.E., Weber, M.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 289 KB

english, 2003

9

Comparison of ionizing radiation effects in 0.18 and 0.25 μm cmos technologies for analog applications

Manghisoni, M., Ratti, L., Re, V., Speziali, V., Traversi, G., Candelori, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 405 KB

english, 2003

10

Let spectra of proton energy levels from 50 to 500 mev and their effectiveness for single event effects characterization of microelectronics

Hiemstra, D.M., Blackmore, E.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 401 KB

english, 2003

11

Microdose analysis of ion strikes on SRAM cells

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 417 KB

english, 2003

12

Neutron irradiation effects in gan-based blue leds

ChyiShiun Li,, Subramanian, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 377 KB

english, 2003

13

Spice modeling of neutron displacement damage and annealing effects in bipolar junction transistors

Yanqing Deng,, Fjeldly, T.A., Ytterdal, T., Shur, M.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 301 KB

english, 2003

14

Comparisons of soft error rate for srams in commercial soi and bulk below the 130-nm technology node

Roche, P., Gasiot, G., Forbes, K., O'Sullivan, V., Ferlet, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 1.01 MB

english, 2003

15

Passivation layers for reduced total dose effects and eldrs in linear bipolar devices

Shaneyfelt, M.R., Pease, R.L., Maher, M.C., Schwank, J.R., Gupta, S., Dodd, P.E., Riewe, L.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 444 KB

english, 2003

16

Proton-irradiation effects on AlGaN/AlN/GaN high electron mobility transistors

Xinwen Hu,, Karmarkar, A.P., Bongim Jun,, Fleetwood, D.M., Schrimpf, R.D., Geil, R.D., Weller, R.A., White, B.D., Bataiev, M., Brillson, L.J., Mishra, U.K.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 356 KB

english, 2003

17

See characterization of vertical dmosfets: an updated test protocol

Titus, J.L., Wheatley, C.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 1.71 MB

english, 2003

18

Three-dimensional mapping of single-event effects using two photon absorption

McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S., Boulghassoul, Y., Massengill, L.W., Pease, R.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 1.56 MB

english, 2003

19

Impact of mechanical stress on total-dose effects in bipolar ics

Boch, J., Fleetwood, D.M., Schrimpf, R.D., Cizmarik, R.R., Saigne, F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 362 KB

english, 2003

20

Contactless ultra-fast laser probing of radiation-induced leakage current in ultra-thin oxides

Pasternak, R., Chatterjee, A., Shirokaya, Y.V., Choi, B.K., Marka, Z., Miller, J.K., Albridge, R.G., Rashkeev, S.N., Pantelides, S.T., Schrimpf, R.D., Fleetwood, D.M., Tolk, N.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 306 KB

english, 2003

21

Evaluating average and atypical response in radiation effects simulations

Weller, R.A., Sternberg, A.L., Massengill, L.W., Schrimpf, R.D., Fleetwood, D.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 667 KB

english, 2003

22

Statistical modeling of radiation-induced proton transport in silicon: deactivation of dopant acceptors in bipolar devices

Rashkeev, S.N., Fleetwood, D.M., Schrimpf, R.D., Pantelides, S.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 365 KB

english, 2003

23

Charge separation techniques for irradiated pseudo-mos soi transistors

Jun, B., Fleetwood, D.M., Schrimpf, R.D., Zhou, X., Montes, E.J., Cristoloveanu, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 382 KB

english, 2003

24

Bulk damage caused by single protons in SDRAMs

Shindou, H., Kuboyama, S., Ikeda, N., Hirao, T., Matsuda, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 303 KB

english, 2003

25

Chalcogenide memory arrays: characterization and radiation effects

Maimon, J.D., Hunt, K.K., Burcin, L., Rodgers, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 869 KB

english, 2003

26

Substrate removal and box thinning effects on total dose response of FDSOI NMOSFET

Gouker, P., Burns, J., Wyatt, P., Warner, K., Austin, E., Milanowski, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 859 KB

english, 2003

27

Prediction of energetic solar particle event dose-time profiles using artificial neural networks

Hoff, J.L., Townsend, L.W., Hines, J.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 307 KB

english, 2003

28

Single particle dark current spikes induced in ccds by high energy neutrons

Chugg, A.M., Jones, R., Moutrie, M.J., Armstrong, J.R., King, D.B.S., Moreau, N.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 443 KB

english, 2003

29

A new wide-range reactor power-measuring channel

Khaleeq, M.T., Zaka, I., Qaiser, H., Nayyar, B.H., Ghumman, I.A., Ali, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 348 KB

english, 2003

30

Electrical, spectral, and chemical properties of 1.8 mev proton irradiated AlGaN/GaN HEMT structures as a function of proton fluence

White, B.D., Bataiev, M., Goss, S.H., Hu, X., Karmarkar, A., Fleetwood, D.M., Schrimpf, R.D., Schaff, W.J., Brillson, L.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 500 KB

english, 2003

31

Effects of γ-rays on JFET devices and circuits fabricated in a detector-compatible process

Dalla Betta, G.F., Manghisoni, M., Ratti, L., Re, V., Speziali, V., Traversi, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 444 KB

english, 2003

32

Proton nonionizing energy loss (niel) for device applications

Insoo Jun,, Xapsos, M.A., Messenger, S.R., Burke, E.A., Walters, R.J., Summers, G.P., Jordan, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 303 KB

english, 2003

33

Radiation-induced charge trapping in thin Al/sub 2/O/sub 3/SiO/sub x/N/sub y/Si[100] gate dielectric stacks

Felix, J.A., Shaneyfelt, M.R., Fleetwood, D.M., Meisenheimer, T.L., Schwank, J.R., Schrimpf, R.D., Dodd, P.E., Gusev, E.P., D'Emic, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 588 KB

english, 2003

34

Mechanisms for radiation dose-rate sensitivity of bipolar transistors

Hjalmarson, H.P., Pease, R.L., Witczak, S.C., Shaneyfelt, M.R., Schwank, J.R., Edwards, A.H., Hembree, C.E., Mattsson, T.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 413 KB

english, 2003

35

Neutron, proton, and electron irradiation effects in InGaP/GaAs single heterojunction bipolar transistors

Vuppala, S., ChyiShiun Li,, Zwicknagl, P., Subramanian, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 724 KB

english, 2003

36

In-flight annealing of displacement damage in gaas leds: a galileo story

Swift, G.M., Levanas, G.C., Ratliff, J.M., Johnston, A.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 473 KB

english, 2003

37

Investigation of single-event transients in voltage-controlled oscillators

Wenjian Chen,, Pouget, V., Barnaby, H.J., Cressler, J.D., Guofu Niu,, Fouillat, P., Deval, Y., Lewis, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 647 KB

english, 2003

38

Neutron dosimetry with planar silicon p-i-n diodes

Rosenfeld, A.B., Yudelev, M., Lerch, M.L.F., Cornelius, I., Griffin, P., Perevertailo, V.L., Anokhin, I.E., Zinets, O.S., Khivrich, V.I., Pinkovskaya, M., Alexiev, D., Reinhard, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 486 KB

english, 2003

39

Model for the geostationary electron environment: pole

Boscher, D.M., Bourdarie, S.A., Friedel, R.H.W., Belian, R.D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 372 KB

english, 2003

40

Effects of 2 mev proton irradiation on operating wavelength and leakage current of vertical cavity surface emitting lasers

Kalavagunta, A., Bo Choi,, Neifeld, M.A., Schrimpf, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 734 KB

english, 2003

41

Terrestrial thermal neutrons

Dirk, J.D., Nelson, M.E., Ziegler, J.F., Thompson, A., Zabel, T.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 621 KB

english, 2003

42

Total dose degradation of mems optical mirrors

Miyahira, T.F., Becker, H.N., McClure, S.S., Edmonds, L.D., Johnston, A.H., Hishinuma, Y.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 308 KB

english, 2003

43

High throughput high resolution vortex/Sup TM/ detector for x-ray diffraction

Iwanczyk, J.S., Patt, B.E., Barkan, S., Feng, L., Tull, C.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 415 KB

english, 2003

44

Modular disk recorder for physics experiments

Changlong Jiang,, Cheng Ma,, Xugang Zhang,, Huibo Jia,, Duanyi Xu,

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 293 KB

english, 2003

45

Irradiation induced degradation of high-speed response of Si p/sup +/-i-n/sup +/ photodiodes studied by pulsed laser measurements

Laird, J.S., Hirao, T., Onoda, S., Itoh, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 855 KB

english, 2003

46

Extensive performance studies for the ATLAS BIS-MDT precision muon chambers with cosmic rays

Alexopoulos, T., Avramidou, R., Bratzler, U., Cernoch, C., Dris, M., Fassouliotis, D., Filippas, T.A., Fokitis, E., Gazis, E.N., Ioannou, P., Katsoufis, E.C., Kourkoumelis, Ch., Krepouri, A., Liolios,

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 373 KB

english, 2003

47

Errata to "Nonionizing energy loss (NIEL) for heavy ions"

Messenger, S.R., Burke, E.A., Summers, G.P., Xapsos, M.A., Walters, R.J., Jackson, E.M., Weaver, B.D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 157 KB

english, 2003

48

Model for the radiation degradation of polycrystalline silicon films

Nakabayashi, M., Ohyama, H., Takakura, K., Simoen, E., Claeys, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 638 KB

english, 2003

49

Total dose orbital data by dosimeter onboard tsubasa (mds-1) satellite

Kimoto, Y., Koshiishi, H., Matsumoto, H., Goka, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 536 KB

english, 2003

50

Neutron contribution to CaF/sub 2/:Mn thermoluminescent dosimeter response in mixed ( n/y ) field environments

DePriest, K.R., Griffin, P.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 531 KB

english, 2003

51

The ALTRO chip: a 16-channel A/D converter and digital processor for gas detectors

Bosch, R.E., Jimenez de Parga, A., Mota, B., Musa, L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 1.01 MB

english, 2003

52

Heavy-ion induced single-event transients in high-speed inp-ingaas avalanche photodiodes

Laird, J.S., Hirao, T., Onoda, S., Ohyama, H., Kamiya, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 1012 KB

english, 2003

53

Single event upset and hardening in 0.15 μm antifuse-based field programmable gate array

Wang, J.J., Wong, W., Wolday, S., Cronquist, B., McCollum, J., Katz, R., Kleyner, I.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 611 KB

english, 2003

54

Eldrs in space: an updated and expanded analysis of the bipolar eldrs experiment on mptb

Turflinger, T.L., Campbell, A.B., Schmeichel, W.M., Walters, R.J., Krieg, J.F., Titus, J.L., Reeves, M., Marshall, P.W., Pease, R.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 393 KB

english, 2003

55

Degradation of instrumentation amplifiers due to the nonionizing energy loss damage

Franco, F.J., Lozano, J., Santos, J.P., Agapito, J.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 367 KB

english, 2003

56

Using proton irradiation to probe the origins of low-frequency noise variations in SiGe hbts

Zhenrong Jin,, Johansen, J.A., Cressler, J.D., Reed, R.A., Marshall, P.W., Joseph, A.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 413 KB

english, 2003

57

Heavy-ion single-event effects testing of lead-on-chip assembled high-density memories

Harboe-Sorensen, R., Guerre, F.-X., Loquet, J.-G., Tizon, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 1.97 MB

english, 2003

58

Short-channel radiation effect in 60 MeV proton irradiated 0.13 μm CMOS transistors

Simoen, E., Mercha, A., Morata, A., Hayama, K., Richardson, G., Rafi, J.M., Augendre, E., Claeys, C., Mohammadzadeh, A., Ohyama, H., Romano-Rodriguez, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 536 KB

english, 2003

59

Proton tolerance of third-generation, 0.12 μm 185 ghz SiGe hbts

Yuan Lu,, Cressler, J.D., Krithivasan, R., Ying Li,, Reed, R.A., Marshall, P.W., Polar, C., Freeman, G., Ahlgren, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 431 KB

english, 2003

60

Impact of proton irradiation on the static and dynamic characteristics of high-voltage 4h-sic jbs switching diodes

Zhiyun Luo,, Tianbing Chen,, Cressler, J.D., Sheridan, D.C., Williams, J.R., Reed, R.A., Marshall, P.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 616 KB

english, 2003

61

Front-end electronics for the CDF-II time-of-flight system

Chen, C., Jones, M., Kononenko, W., Kroll, J., Mayers, G.M., Newcomer, F.M., Oldeman, R.G.C., Usynin, D., Van Berg, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 270 KB

english, 2003

62

Enhanced avalanche multiplication factor and single-event burnout

Kuboyama, S., Ikeda, N., Hirao, T., Matsuda, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 319 KB

english, 2003

63

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-μm SiGe heterojunction bipolar transistors and circuits

Reed, R.A., Marshall, P.W., Pickel, J.C., Carts, M.A., Fodness, B., Guofu Niu,, Fritz, K., Vizkelethy, G., Dodd, P.E., Irwin, T., Cressler, J.D., Krithivasan, R., Riggs, P., Prairie, J., Randall, B.,

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 439 KB

english, 2003

64

Solar particle enhancements of single-event effect rates at aircraft altitudes

Dyer, C.S., Lei, F., Clucas, S.N., Smart, D.F., Shea, M.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 586 KB

english, 2003

65

Seu mitigation for half-latches in xilinx virtex FPGAs

Graham, P., Caffrey, M., Johnson, D.E., Rollins, N., Wirthlin, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 374 KB

english, 2003

66

Comparison of nmos and pmos transistor sensitivity to seu in srams by device simulation

K. Castellani-Coulie, B. Sagnes

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 926 KB

english, 2003

67

Radiation hardness of czochralski silicon studied by 10-mev and 20-mev protons

Tuominen, E., Harkonen, J., Tuovinen, E., Lassila-Perini, K., Luukka, P., Mehtala, P., Nummela, S., Nysten, J., Zibellini, A., Li, Z., Heikkila, P., Ovchinnikov, V., Yli-Koski, M., Laitinen, P., Piroj

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 396 KB

english, 2003

68

Total-dose and single-event effects in DC/DC converter control circuitry

Adell, P.C., Schrimpf, R.D., Holman, W.T., Boch, J., Stacey, J., Ribero, P., Sternberg, A., Galloway, K.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 441 KB

english, 2003

69

Proton tolerance of multiple-threshold voltage and multiple-breakdown voltage cmos device design points in a 0.18 μm system-on-a-chip cmos technology

Ying Li,, Cressler, J.D., Yuan Lu,, Jun Pan,, Guofu Niu,, Reed, R.A., Marshall, P.W., Polar, C., Palmer, M.J., Joseph, A.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 341 KB

english, 2003

70

Proton-induced secondary particle environment for infrared sensor applications

Pickel, J.C., Reed, R.A., Marshall, P.W., Jordan, T.M., Gee, G., Fodness, B., McKelvey, M., McMurray, R.E., Ennico, K.A., Johnson, R.R., McCreight, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 367 KB

english, 2003

71

Bias dependence of fd transistor response to total dose irradiation

Flament, O., Torres, A., Ferlet-Cavrois, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 395 KB

english, 2003

72

Simultaneous measurements of absolute numbers of electrons and scintillation photons produced by 5.49 MeV alpha particles in rare gases

Saito, K., Sasaki, S., Tawara, H., Sanami, T., Shibamura, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 537 KB

english, 2003

73

Carrington flare of 1859 as a prototypical worst-case solar energetic particle event

Townsend, L.W., Zapp, E.N., Stephens, D.L., Hoff, J.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 195 KB

english, 2003

74

Impact of data cache memory on the single event upset-induced error rate of microprocessors

Faure, F., Velazco, R., Violante, M., Rebaudengo, M., Reorda, M.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 301 KB

english, 2003

75

Single-event effects in 0.18 μm cmos commercial processes

Makihara, A., Sakaide, Y., Tsuchiya, Y., Arimitsu, T., Asai, H., Iide, Y., Shindou, H., Kuboyama, S., Matsuda, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 423 KB

english, 2003

76

Modeling single-event effects in a complex digital device

Clark, K.A., Ross, A.A., Loomis, H.H., Weatherford, T.R., Fouts, D.J., Buchner, S.P., McMorrow, D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 885 KB

english, 2003

77

Probing proton damage in soi cmos technology by using lateral bipolar action

Ying Li,, Guofu Niu,, Cressler, J.D., Patel, J., Mike Liu,, Mojarradi, M.M., Reed, R.A., Marshall, P.W., Blalock, B.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 453 KB

english, 2003

78

Statistical model for radiation-induced wear-out of ultra-thin gate oxides after exposure to heavy ion irradiation

Cester, A., Cimino, S., Miranda, E., Candelori, A., Ghidini, G., Paccagnella, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 571 KB

english, 2003

79

Proton-induced transients and charge collection measurements in a lwir hgcdte focal plane array

Marshall, P.W., Hubbs, J.E., Arrington, D.C., Marshall, C.J., Reed, R.A., Gee, G., Pickel, J.C., Ramos, R.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 1.03 MB

english, 2003

80

The role of nanoclusters in reducing hole trapping in ion implanted oxides

Mrstik, B.J., Hughes, H.L., Gouker, P., Lawrence, R.K., McMarr, P.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 429 KB

english, 2003

81

Data retention after heavy ion exposure of floating gate memories: analysis and simulation

Larcher, L., Cellere, G., Paccagnella, A., Chimenton, A., Candelori, A., Modelli, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 530 KB

english, 2003

82

Charge collection by capacitive influence through isolation oxides

Ferlet-Cavrois, V., Paillet, P., Schwank, J.R., Vizkelethy, G., Shaneyfelt, M.R., Baggio, J., Torres, A., Flament, O.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 2.41 MB

english, 2003

83

Correlation of neutron dosimetry using a silicon equivalent proportional counter microdosimeter and sram seu cross sections for eight neutron energy spectra

Gersey, B., Wilkins, R., Huff, H., Dwivedi, R.C., Takala, B., O'Donnell, J., Wender, S.A., Singleterry, R.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 297 KB

english, 2003

84

Single event effects in PDSOI 4 M SRAM fabricated in UNIBOND

Liu, S.T., Heikkila, W.W., Golke, K.W., Anthony, D., Hurst, A., Kirchner, G., Jenkins, W.C., Hughes, H.L., Mitra, S., Ioannou, D.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 375 KB

english, 2003

85

Grazing angle proton scattering: effects on chandra and xmm-newton x-ray telescopes

Dichter, B.K., Woolf, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 242 KB

english, 2003

86

Modeling of proton-induced ccd degradation in the chandra x-ray observatory

Lo, D.H., Srour, J.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 431 KB

english, 2003

87

The esa standard radiation environment monitor program first results from PROBA-I and INTEGRAL

Mohammadzadeh, A., Evans, H., Nieminen, P., Daly, E., Vuilleumier, P., Buhler, P., Eggel, C., Hajdas, W., Schlumpf, N., Zehnder, A., Schneider, J., Fear, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 751 KB

english, 2003

88

Errata to "X-ray stereotactic lesion localization in conjunction with dedicated scintimammography"

More, M.J., Narayanan, D., Goodale, P.J., Majewski, S., Welch, B., Wojcik, R., Williams, M.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 149 KB

english, 2003

89

A single event latchup suppression technique for COTS CMOS ICs

Spratt, J.P., Pickel, J.C., Leadon, R.E., Lacoe, R.C., Moss, S.C., LaLumondiere, S.D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 1.11 MB

english, 2003

90

Criteria for the selection of dosimetry cross sections

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 720 KB

english, 2003

91

Dependence of the por and nbohc defects as function of the dose in hydrogen-treated and untreated ku1 glass fibers

Brichard, B., Fernandez, A.F., Ooms, H., Borgermans, P., Berghmans, F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 318 KB

english, 2003

92

Neutron-induced pion production in silicon-based circuits

Kinnison, J.D., Maurer, R., Roth, D.R., McNulty, P.J., Abdel-Kader, W.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 403 KB

english, 2003

93

Applicability of circuit macromodeling to analog single-event transient analysis

Boulghassoul, Y., Rowe, J.D., Massengill, L.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 444 KB

english, 2003

94

First results from cryogenic avalanche detectors based on gas electron multipliers

Buzulutskov, A., Bondar, A., Shekhtman, L., Snopkov, R., Tikhonov, Y.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 260 KB

english, 2003

95

Soft error rate increase for new generations of srams

Granlund, T., Bo Granbom,, Olsson, N.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 257 KB

english, 2003

96

Development of X-ray scanner using 450-kVp X-ray

Sung-Woo Kwak,, Kwang Hyun Kim,, Insu Kim,, Gyuseong Cho,

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 305 KB

english, 2003

97

The impact of gamma irradiation on SiGe hbts operating at cryogenic temperatures

Cressler, J.D., Krithivasan, R., Sutton, A.K., Seiler, J.E., Krieg, J.F., Clark, S.D., Joseph, A.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 402 KB

english, 2003

98

Contribution of SiO/sub 2/ in neutron-induced seu in SRAMs

Wrobel, F., Palau, J.-M., Calvet, M.-C., Iacconi, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 293 KB

english, 2003

99

3-d simulation of heavy-ion induced charge collection in SiGe HBTs

Varadharajaperumal, M., Guofu Niu,, Krithivasan, R., Cressler, J.D., Reed, R.A., Marshall, P.W., Vizkelethy, G., Dodd, P.E., Joseph, A.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 886 KB

english, 2003

100

Response of piezoresistive mems accelerometers and pressure transducers to high gamma dose

Holbert, K.E., Nessel, J.A., McCready, S.S., Heger, A.S., Harlow, T.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 667 KB

english, 2003

101

Niel for heavy ions: an analytical approach

Messenger, S.R., Burke, E.A., Xapsos, M.A., Summers, G.P., Walters, R.J., Insoo Jun,, Jordan, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 423 KB

english, 2003

102

Single-event upset in evolving commercial silicon-on-insulator microprocessor technologies

Irom, F., Farmanesh, F.H., Swift, G.M., Johnston, A.H., Yoder, G.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 270 KB

english, 2003

103

An seu hardening approach for high-speed sige hbt digital logic

Krithivasan, R., Guofu Niu,, Cressler, J.D., Currie, S.M., Fritz, K.E., Reed, R.A., Marshall, P.W., Riggs, P.A., Randall, B.A., Gilbert, B.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 737 KB

english, 2003

104

2003 IEEE nuclear and space radiation effects conference outstanding conference paper award

McMorrow, D., Lotshaw, W.T., Melinger, J.S., Buchner, S.P., Boulghassoul, Y., Massengill, L.W., Pease, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 231 KB

english, 2003

105

A compact portable setup for in situ solar cells degradation

Filevich, A., Bruno, C.J., Vazquez, J.F., Alurralde, M., Prario, I., Tamasi, M.J.L., Bogado, M.G.M., Pla, J.C., Duran, J., Schuff, J., Burlon, A., Stoliar, P., Minsky, D., Kreiner, A.J., Mayer, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 186 KB

english, 2003

106

In Memoriam Douglas George Millward

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 78 KB

english, 2003

107

Super-radiation hard particle tracking at the CERN SLHC

Rahman, M., Bates, R., Blue, A., Cunningham, W., Gaubas, E., Gouldwell, A., Horn, M., Kazukauskas, V., Parkes, C., Quinn, T., Roy, P., O'Shea, V., Smith, K.M., Vaitkus, J., Wright, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 605 KB

english, 2003

108

14-mev neutron and co/sub 60/ gamma testing of a power mosfet optocoupler

McMarr, P.J., Nelson, M.E., Hughes, H., Delikat, K.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 392 KB

english, 2003

109

Hardening of a radiation sensor based on optically stimulated luminescence

Vaille, J.-R., Ducret, S., Idri, K., Saigne, F., Matias, S., Iborra, N., Germanicus, R., Ecoffet, R., Dusseau, L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 267 KB

english, 2003

110

The influence of structural characteristics on the response of silicon avalanche photodiodes to proton irradiation

Becker, H.N., Miyahira, T.F., Johnston, A.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 226 KB

english, 2003

111

Let dependence of the charge collection efficiency of silicon microdosimeters

Cornelius, I.M., Rosenfeld, A.B., Siegele, R., Cohen, D.D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 724 KB

english, 2003

112

Using a system-level bit-error-rate model to predict on-orbit performance

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 311 KB

english, 2003

113

2003 IEEE nuclear and space radiation effects conference awards chairman's comments

Hopkinson, G.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 19 KB

english, 2003

114

In Memoriam George J. Brucker: September 15, 1921 ¿ August 1, 2003

Stassinopoulos, E.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 12 KB

english, 2003

115

2003 nuclear and space radiation effects conference comments by the general chairman

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 21 KB

english, 2003

116

2003 special nsrec issue of the IEEE Transactions on nuclear science comments by the guest editor

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 14 KB

english, 2003

117

In Memoriam James R. Coss

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 166 KB

english, 2003

118

2002 IEEE Nuclear Science Symposium (NSS) and Symposium on Nuclear Power Systems

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 183 KB

english, 2003

119

Conference author index

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 20 KB

english, 2003

120

2003 special NSREC issue of the IEEE Transactions on nuclear science list of reviewers

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 139 KB

english, 2003

121

In Memoriam Charles T. Ty Self

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 137 KB

english, 2003

122

Author Index

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 363 KB

english, 2003

123

Subject index

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

File:

PDF, 392 KB

2003

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