Model for CMOS/SOI single-event vulnerability

IEEE Transactions on Nuclear Science 1989 / Dec. Vol. 36; Iss. 6

Model for CMOS/SOI single-event vulnerability

Kerns, S.E., Massengill, L.W., Kerns, D.V., Alles, M.L., Houston, T.W., Lu, H., Hite, L.R.
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Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45440
Date:
January, 1989
File:
PDF, 605 KB
english, 1989
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