![](/img/cover-not-exists.png)
Model for CMOS/SOI single-event vulnerability
Kerns, S.E., Massengill, L.W., Kerns, D.V., Alles, M.L., Houston, T.W., Lu, H., Hite, L.R.Volume:
36
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.45440
Date:
January, 1989
File:
PDF, 605 KB
english, 1989