Volume 36; Issue 6

IEEE Transactions on Nuclear Science

Volume 36; Issue 6

1

Relation between electrostatic discharge rate and outgassing rate

Bogorad, A., Bowman, C., Loman, J., Bouknight, R., Armenti, J., Lloyd, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 463 KB

english, 1989

2

Development of cosmic ray hardened power MOSFET's

Titus, J.L., Jamiolkowski, L.S., Wheatley, C.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 693 KB

english, 1989

3

Model for CMOS/SOI single-event vulnerability

Kerns, S.E., Massengill, L.W., Kerns, D.V., Alles, M.L., Houston, T.W., Lu, H., Hite, L.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 605 KB

english, 1989

4

Reoxidized nitrided oxide for radiation-hardened MOS devices

Dunn, G.J., Wyatt, P.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 641 KB

english, 1989

5

Analysis of current-mirror MOSFETs for use in total-dose radiation environments

Martinez, M.J., Schrimpf, R.D., Galloway, K.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 453 KB

english, 1989

6

Heavy ion induced snapback in CMOS devices

Koga, R., Kolasinski, W.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 498 KB

english, 1989

7

Effects of neutron irradiation on GaAs/AlGaAs heterojunction bipolar transistors

Song, Y., Kim, M.E., Oki, A.K., Hafizi, M.E., Murlin, W.D., Camou, J.B., Kobayashi, K.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 566 KB

english, 1989

8

The effect of circuit topology on radiation-induced latchup

Johnston, A.H., Plaag, R.E., Baze, M.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 872 KB

english, 1989

9

Correlation between channel hot-electron degradation and radiation-induced interface trapping in MOS devices

Palkuti, L.J., Ormond, R.D., Hu, C., Chung, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 625 KB

english, 1989

10

Features of the triggering mechanism for single event burnout of power MOSFETs

Hohl, J.H., Johnnson, G.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 693 KB

english, 1989

11

Radiation effects on UHF power MOSFETs

Okabe, T., Kato, M., Katsueda, M., Takei, I., Ikeda, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 591 KB

english, 1989

12

Radiation dependence of inverter propagation delay from timing sampler measurements

Buehler, M.G., Blaes, B.R., Lin, Y.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 667 KB

english, 1989

13

Proton, neutron and electron-induced displacement damage in germanium

Marshall, P.W., Dale, C.J., Summers, G.P., Wolicki, E.A., Burke, E.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 618 KB

english, 1989

14

Comparison of experimental pulse-height distributions in germanium detectors with Integrated-Tiger-Series-code predictions

Beutler, D.E., Halbleib, J.A., Knott, D.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 693 KB

english, 1989

15

Displacement damage extremes in silicon depletion regions

Marshall, P.W., Dale, C.J., Burke, E.A., Summers, G.P., Bender, G.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 795 KB

english, 1989

16

Suboptimal projective control of a pressurized water reactor

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 623 KB

english, 1989

17

Apparatus for real-time size and speed measurements of blow-off particulates from pulsed irradiation experiments

Von Benken, C., Johnson, E.A., Nordberg, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 510 KB

english, 1989

18

Depletion region geometry analysis applied to single event sensitivity

Langworthy, J.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 878 KB

english, 1989

19

The measurement and prediction of proton upset

Shimano, Y., Goka, T., Kuboyama, S., Kawachi, K., Kanai, T., Takami, Y.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 341 KB

english, 1989

20

Co-60 and neutron irradiation of MOS-controlled thyristors

Loescher, D.H., Dawes, W.R., King, D.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 289 KB

english, 1989

21

Latest trends in parts SEP susceptibility from heavy ions

Nichols, D.K., Smith, L.S., Soli, G.A., Koga, R., Kolasinski, W.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 535 KB

english, 1989

22

Measurements of the SEU environment in the upper atmosphere

Dyer, C.S., Sims, A.J., Farren, J., Stephen, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 404 KB

english, 1989

23

Radiation field from an extended planar-anode diode on HERMES III

Sanford, T.W.L., Halbleib, J.A., Poukey, J.W., Beutler, D.E., Carlson, G.A., Baldwin, G.T., Sheridan, T., Mock, R., Klingler, R.S., Knott, D.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 491 KB

english, 1989

24

An improved standard total dose test for CMOS space electronics

Fleetwood, D.M., Winokur, P.S., Riewe, L.C., Pease, R.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 829 KB

english, 1989

25

Photocurrent modeling at high dose rates

Ishaque, A.N., Howard, J.W., Becker, M., Block, R.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 580 KB

english, 1989

26

Response of GaAs displacement damage monitors to protons, electrons, and gamma radiation

Barry, A.L., Wojcik, R., MacDiarmid, A.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 478 KB

english, 1989

27

Radiation response of optically-triggered GaAs thyristors

Carson, R.F., Hughes, R.C., Zipperian, T.E., Weaver, H.T., Brennan, T.M., Hammons, B.E., Klem, J.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 678 KB

english, 1989

28

Interface trap formation via the two-stage H/sup +/ process

Saks, N.S., Brown, D.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 1.10 MB

english, 1989

29

Comparison of MOS capacitor and transistor postirradiation response

McWhorter, P.J., Fleetwood, D.M., Pastorek, R.A., Zimmerman, G.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 888 KB

english, 1989

30

An overview of electron and ion beam effects in charging and discharging to spacecraft

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 528 KB

english, 1989

31

Time-domain calculation of the leakage of SGEMP transients through braided cable shields

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 662 KB

english, 1989

32

Radiation belt dynamics during solar minimum

Gussenhoven, M.S., Mullen, E.G., Holeman, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 656 KB

english, 1989

33

Neutron/gamma induced damage mechanisms and synergistic effects in GaAs MESFETs

Chang, J.Y., Badawi, M.H., DeCicco, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 704 KB

english, 1989

34

Theory and application of dual-transistor charge separation analysis

Fleetwood, D.M., Shaneyfelt, M.R., Schwank, J.R., Winokur, P.S., Sexton, F.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 934 KB

english, 1989

35

Total dose radiation effects for implanted buried oxides

Brady, F.T., Krull, W.A., Li, S.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 452 KB

english, 1989

36

A diagnostic expert system for the nuclear power plant based on the hybrid knowledge approach

Yoon On Yang,, Soon Heung Chang,

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 832 KB

english, 1989

37

Spacecraft charging in the supra-auroral region

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 392 KB

english, 1989

38

Circumvention of radiation-induced noise in CCD and CID imagers

Yates, G.J., Turko, B.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 976 KB

english, 1989

39

Total dose induced hole trapping in trench oxides

Enlow, E.W., Pease, R.L., Combs, W.E., Platteter, D.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 747 KB

english, 1989

40

A model for proton-induced SEU

Bion, T., Bourrieau, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 535 KB

english, 1989

41

Radiation effects on ion-implanted silicon-dioxide films

Kato, M., Watanabe, K., Okabe, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 465 KB

english, 1989

42

ELO SOI technology for radiation hard devices

Liu, S.T., Lai, J., Fechner, P., Holt, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 498 KB

english, 1989

43

Dose dependence of interface traps in gate oxides at high levels of total dose

Baze, M.P., Plaag, R.E., Johnson, A.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 617 KB

english, 1989

44

SEU characterization of hardened CMOS SRAMs using statistical analysis of feedback delay in memory cells

Kohler, R.A., Koga, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 509 KB

english, 1989

45

Characteristics of GaAs DCFL MESFET's and inverters exposed to high-energy neutrons

Bloss, W.L., Yamada, W.E., Rosenbluth, M.L., Janousek, B.K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 661 KB

english, 1989

46

Neutron effects in high-power GaAs laser diodes

Carson, R.F., Chow, W.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 590 KB

english, 1989

47

A chip-level modeling approach for rail span collapse and survivability analyses

Mavis, D.G., Alexander, D.R., Dinger, G.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 747 KB

english, 1989

48

Radiation response of floating gate EEPROM memory cells

Snyder, E.S., McWhorter, P.J., Dellin, T.A., Sweetman, J.D.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 838 KB

english, 1989

49

Variation in SEU sensitivity of dose-imprinted CMOS SRAMs

Stassinopoulos, E.G., Brucker, G.J., Van Gunten, O., Kim, H.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 785 KB

english, 1989

50

SEU measurements on HFETs and HFET SRAMs

Remke, R.L., Witmer, S.B., Jones, S.D.F., Barber, F.E., Flesner, L.D., O'Brien, M.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 453 KB

english, 1989

51

CMOS VLSI single event transient characterization

Heileman, S.J., Eisenstadt, W.R., Fox, R.M., Wagner, R.S., Bordes, N., Bradley, J.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 504 KB

english, 1989

52

Enhanced displacement damage effectiveness in irradiated silicon devices

Srour, J.R., Hartmann, R.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 627 KB

english, 1989

53

The nature of the trapped hole annealing process

Lelis, A.J., Oldham, T.R., Boesch, H.E., McLean, F.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 859 KB

english, 1989

54

Slow wave pickups to measure the transverse temperature in an electron cooling experiment

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 399 KB

english, 1989

55

Non-random single event upset trends

McDonald, P.T., Stapor, W.J., Campbell, A.B., Massengill, L.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 542 KB

english, 1989

56

Application of a model for treatment of time dependent effects on irradiation of microelectronic devices

Brown, D.B., Jenkins, W.C., Johnston, A.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 955 KB

english, 1989

57

Comparison between Californian and cyclotron SEU tests

Velazco, R., Provost-Grellier, A., Chapuis, T., Labrunee, M., Falguere, D., Koga, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 320 KB

english, 1989

58

Orientation dependence of interface-trap transformation

Wang, Y., Ma, T.P., Barker, R.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 719 KB

english, 1989

59

Transient radiation test techniques for high-speed analog-to-digital converters

Turflinger, T.L., Davey, M.V.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 493 KB

english, 1989

60

Leaky insulating paint for preventing discharge anomalies on circuit boards

Frederickson, A.R., Nanevicz, J.E., Thayer, J.S., Enloe, C.L., Mullen, E.G., Parkinson, D.B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 557 KB

english, 1989

61

The effect of neutron irradiation on silicon photodiodes

Korde, R., Ojha, A., Braasch, R., English, T.C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 595 KB

english, 1989

62

Radiation characterization of a 28C256 EEPROM

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 462 KB

english, 1989

63

Proton damage effects in an EEV CCD imager

Hopkinson, G.R., Chlebek, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 709 KB

english, 1989

64

Dynamic coupling of SGEMP cavity fields to particulate magnetic media

Markes, M.E., Book, P.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 618 KB

english, 1989

65

Characteristics of GaAs heterojunction FETs (HFETs) and source follower FET logic (SFFL) inverters exposed to high energy neutrons

Janousek, B.K., Krantz, R.J., Bloss, W.L., Yamada, W.E., Brown, S., Remke, R.L., Witmer, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 425 KB

english, 1989

66

The effects of ionizing radiation on power-MOSFET termination structures

Davis, K.R., Schrimpf, R.D., Cellier, F.E., Galloway, K.F., Burton, D.I., Wheatley, C.F.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 513 KB

english, 1989

67

Accuracy of the charge pumping technique for small geometry MOSFETs

Gaitan, M., Enlow, E.W., Russell, T.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 635 KB

english, 1989

68

Monte Carlo calculations of the vacuum Compton detector sensitivities

Hsu, H.-H., Lee, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 387 KB

english, 1989

69

Geometric components of charge pumping current in SOS devices

Stahlbush, R.E., Lawrence, R.K., Richards, W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 844 KB

english, 1989

70

Radiation hardened micron and submicron MOSFETs containing fluorinated oxides

Nishioka, Y., Ohyu, K., Ohji, Y., Kato, M., da Silva, E.F., Ma, T.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 686 KB

english, 1989

71

Characterization of neutron radiation damage in GaAs

Griffin, P.J., Lazo, M.S., Luera, T.F., Kelly, J.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 745 KB

english, 1989

72

SOI transistor measurement techniques using body contacted transistors

Worley, E.R., Williams, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 549 KB

english, 1989

73

The random nature of energy deposition in gate oxides

Xapsos, M.A., Freitag, R.K., Burke, E.A., Dozier, C.M., Brown, D.B., Summers, G.P.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 810 KB

english, 1989

74

The generation lifetime damage factor and its variance in silicon

Dale, C.J., Marshall, P.W., Burke, E.A., Summers, G.P., Bender, G.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 884 KB

english, 1989

75

A spin dependent recombination study of radiation induced defects at and near the Si/SiO/sub 2/ interface

Jupina, M.A., Lenahan, P.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 714 KB

english, 1989

76

Ion induced charge collection in GaAs MESFETs

Campbell, A., Knudson, A., McMorrow, D., Anderson, W., Roussos, J., Espy, S., Buchner, S., Kang, K., Kerns, D., Kens, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 895 KB

english, 1989

77

Time-dependent degradation of MOSFET channel mobility following pulsed irradiation

McLean, F.B., Boesch, H.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 1.28 MB

english, 1989

78

Charge collection and SEU sensitivity for Ga/As bipolar devices

Yaktieen, M.H., McNulty, P.J., Lynch, J.E., Roth, D.R., Salzman, J.F., Yuan, J.H.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 358 KB

english, 1989

79

The direct measurement of dose enhancement in gamma test facilities

Burke, E.A., Lowe, L.F., Snowden, D.P., Capelli, J.R., Mittleman, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 634 KB

english, 1989

80

Irradiation of LWIR detectors with X-rays generated near the sample

Flesner, L.D., O'Brien, M.E., Rogers, C.G., Moore, T.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 398 KB

english, 1989

81

SEU characterization of a hardened CMOS 64K and 256K SRAM

Sexton, F.W., Fu, J.S., Kohler, R.A., Koga, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 704 KB

english, 1989

82

Gallium arsenide solar cell radiation damage study

Maurer, R.H., Herbert, G.A., Kinnison, J.D., Meulenberg, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 769 KB

english, 1989

83

Radiation effects on p/sup +/ poly gate MOS structures with thin oxides

Yoshii, I., Hama, K., Maeguchi, K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 613 KB

english, 1989

84

Time dependent annealing of radiation-induced leakage currents in MOS devices

Terrell, J.M., Oldham, T.R., Lelis, A.J., Benedetto, J.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 609 KB

english, 1989

85

Incorporation of ENDF-V neutron cross section data for calculating neutron-induced single event upsets

Normand, E., Doherty, W.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 798 KB

english, 1989

86

Correlation between preirradiation 1/f noise and postirradiation oxide-trapped charge in MOS transistors

Scofield, J.H., Doerr, T.P., Fleetwood, D.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 709 KB

english, 1989

87

Spacecraft-level current-injection testing to investigate discharge coupling models

Bowman, C., Bogorad, A., Shih, P., Tasca, D., Shomberg, M., Armenti, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 714 KB

english, 1989

88

Proton induced upsets in the low altitude polar orbit

Adams, L., Harboe-Sorensen, R., Daly, E., Ward, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 296 KB

english, 1989

89

Electron and proton radiation effects in the high temperature superconductor YBa/sub 2/Cu/sub 3/O/sub 7- delta /

Summers, G.P., Chrisey, D.B., Maisch, W.G., Stauss, G.H., Burke, E.A., Nastasi, M., Tesmer, J.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 686 KB

english, 1989

90

Scattering effects of electric and magnetic field probes

Norgard, J.D., Sega, R.M., Harrison, M., Pesta, A., Seifert, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 855 KB

english, 1989

91

A radiation-hardened 16/32-bit microprocessor

Hass, K.J., Treece, R.K., Giddings, A.E.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 628 KB

english, 1989

92

Strategies for lot acceptance testing using CMOS transistors and ICs

Schwank, J.R., Sexton, F.W., Fleetwood, D.M., Shaneyfelt, M.R., Hughes, K.L., Rodgers, M.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 1.01 MB

english, 1989

93

1989 IEEE Annual Nuclear and Space Radiation Effects Conference

Journal:

IEEE Transactions on Nuclear Science

Year:

1989

Language:

english

File:

PDF, 380 KB

english, 1989

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

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