The Enhanced Role of Shallow-Trench Isolation in Ionizing...

IEEE Transactions on Nuclear Science 2009 / 12 Vol. 56; Iss. 6

The Enhanced Role of Shallow-Trench Isolation in Ionizing Radiation Damage of 65 nm RF-CMOS on SOI

Madan, Anuj, Verma, Rohan, Arora, Rajan, Wilcox, Edward P., Cressler, John D., Marshall, Paul W., Schrimpf, Ronald D., Cheng, Peter F., Del Castillo, Linda Y., Liang, Qingqing, Freeman, Greg
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
56
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2009.2033998
Date:
December, 2009
File:
PDF, 924 KB
english, 2009
Conversion to is in progress
Conversion to is failed