Volume 56; Issue 6

IEEE Transactions on Nuclear Science

Volume 56; Issue 6

1

Device-Physics-Based Analytical Model for Single-Event Transients in SOI CMOS Logic

Kobayashi, Daisuke, Hirose, Kazuyuki, Ferlet-Cavrois, VÉronique, McMorrow, Dale, Makino, Takahiro, Ikeda, Hirokazu, Arai, Yasuo, Ohno, Morifumi

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 264 KB

english, 2009

2

Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM

Heidel, David F., Marshall, Paul W., Pellish, Jonathan A., Rodbell, Kenneth P., LaBel, Kenneth A., Schwank, James R., Rauch, Stewart E., Hakey, Mark C., Berg, Melanie D., Castaneda, Carlos M., Dodd, P

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 660 KB

english, 2009

3

The Enhanced Role of Shallow-Trench Isolation in Ionizing Radiation Damage of 65 nm RF-CMOS on SOI

Madan, Anuj, Verma, Rohan, Arora, Rajan, Wilcox, Edward P., Cressler, John D., Marshall, Paul W., Schrimpf, Ronald D., Cheng, Peter F., Del Castillo, Linda Y., Liang, Qingqing, Freeman, Greg

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 924 KB

english, 2009

4

Effect of Total Ionizing Dose on a Bulk 130 nm Ring Oscillator Operating at Ultra-Low Power

Casey, Megan C., Armstrong, Sarah E., Arora, Rajan, King, Michael P., Ahlbin, Jonathan R., Francis, S. Ashley, Bhuva, Bharat L., McMorrow, Dale, Hughes, Harold L., McMarr, Patrick J., Melinger, Joseph

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 719 KB

english, 2009

5

Radiation Hardened By Design Digital I/O for High SEE and TID Immunity

Clark, Lawrence T., Nielsen, Kyle E., Holbert, Keith E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 901 KB

english, 2009

6

Heavy-Ion Induced Single Event Gate Damage in Medium Voltage Power MOSFETs

Busatto, Giovanni, Curro, Giuseppe, Iannuzzo, Francesco, Porzio, Antonino, Sanseverino, Annunziata, Velardi, Francesco

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 683 KB

english, 2009

7

SRAM FPGA Reliability Analysis for Harsh Radiation Environments

Ostler, Patrick S., Caffrey, Michael P., Gibelyou, Derrick S., Graham, Paul S., Morgan, Keith S., Pratt, Brian H., Quinn, Heather M., Wirthlin, Michael J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 649 KB

english, 2009

8

A Soft Error Tolerant 10T SRAM Bit-Cell With Differential Read Capability

Jahinuzzaman, Shah M., Rennie, David J., Sachdev, Manoj

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 745 KB

english, 2009

9

Radiation Effects on Ytterbium- and Ytterbium/Erbium-Doped Double-Clad Optical Fibers

Girard, S., Ouerdane, Y., Tortech, B., Marcandella, C., Robin, T., Cadier, B., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Boukenter, A., Meunier, J.-P., Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 746 KB

english, 2009

10

Heavy-Ion Induced Charge Yield in MOSFETs

Javanainen, Arto, Schwank, James R., Shaneyfelt, Marty R., Harboe-Sorensen, Reno, Virtanen, Ari, Kettunen, H., Dalton, Scott M., Dodd, Paul E., Jaksic, Aleksandar B.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 490 KB

english, 2009

11

A Statistical Approach to Microdose Induced Degradation in FinFET Devices

Griffoni, Alessio, Gerardin, Simone, Roussel, Philippe J., Degraeve, Robin, Meneghesso, Gaudenzio, Paccagnella, Alessandro, Simoen, Eddy, Claeys, Cor

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 707 KB

english, 2009

12

Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies

Gadlage, Matthew J., Ahlbin, Jonathan R., Ramachandran, Vishwanath, Gouker, Pascale, Dinkins, Cody A., Bhuva, Bharat L., Narasimham, Balaji, Schrimpf, Ronald D., McCurdy, Michael W., Alles, Michael L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 751 KB

english, 2009

13

Scintillation Properties of LuAG:Ce, YAG:Ce and LYSO:Ce Crystals for Gamma-Ray Detection

Chewpraditkul, W., Swiderski, L., Moszynski, M., Szczesniak, T., Syntfeld-Kazuch, A., Wanarak, C., Limsuwan, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 226 KB

english, 2009

14

Development of a Radiation-Hardened Lateral Power MOSFET for POL Applications

Dodd, P. E., Shaneyfelt, M. R., Draper, B. L., Young, R. W., Savignon, D., Witcher, J. B., Vizkelethy, G., Schwank, J. R., Shen, Z. J., Shea, P., Landowski, M., Dalton, S. M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 996 KB

english, 2009

15

The Effects of Temperature and Electron Radiation on the Electrical Properties of AlGaN/GaN HFETs

Moran, Jeffrey T., McClory, John W., Petrosky, James C., Farlow, Gary C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 492 KB

english, 2009

16

PIXE Simulation With Geant4

Pia, Maria Grazia, Weidenspointner, Georg, Augelli, Mauro, Quintieri, Lina, Saracco, Paolo, Sudhakar, Manju, Zoglauer, Andreas

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 5.47 MB

english, 2009

17

The Role of Atomic Displacements in Ion-Induced Dielectric Breakdown

Beck, M. J., Puzyrev, Y. S., Sergueev, N., Varga, K., Schrimpf, R. D., Fleetwood, D. M., Pantelides, S. T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 671 KB

english, 2009

18

Charge Generation by Secondary Particles From Nuclear Reactions in BEOL Materials

Dodds, N. A., Reed, R. A., Mendenhall, M. H., Weller, R. A., Clemens, M. A., Dodd, P. E., Shaneyfelt, M. R., Vizkelethy, G., Schwank, J. R., Ferlet-Cavrois, V., Adams, J. H., Schrimpf, R. D., King, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 739 KB

english, 2009

19

Effect of Loop Configuration on Steam Drum Level Control for a Multiple Drum Interconnected Loops Pressure Tube Type Boiling Water Reactor

Gaikwad, Avinash J., Vijayan, P. K., Iyer, Kannan, Bhartiya, Sharad, Kumar, Rajesh, Lele, H. G., Ghosh, A. K., Kushwaha, H. S., Sinha, R. K.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 2.50 MB

english, 2009

20

Laser Verification of Charge Sharing in a 90 nm Bulk CMOS Process

Amusan, O. A., Casey, M. C., Bhuva, B. L., McMorrow, D., Gadlage, M. J., Melinger, J. S., Massengill, L. W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 751 KB

english, 2009

21

Radiation Effects in Type-Two Antimonide Superlattice Infrared Detectors

Weaver, B. D., Aifer, E. H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 106 KB

english, 2009

22

Electron Nonionizing Energy Loss for Device Applications

Jun, Insoo, Kim, Wousik, Evans, Robin

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 792 KB

english, 2009

23

Transient Response of Charge Collection by Single Ion Strike in 4H-SiC MESFETs

Onoda, Shinobu, Iwamoto, Naoya, Ono, Shuich, Katakami, Shuji, Arai, Manabu, Kawano, Katsuyasu, Ohshima, Takeshi

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 239 KB

english, 2009

24

Clock and Reset Transients in a 90 nm RHBD Single-Core Tilera Processor

Cabanas-Holmen, M., Cannon, E.H., Kleinosowski, A., Ballast, J., Killens, J., Socha, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 737 KB

english, 2009

25

Clock, Flip-Flop, and Combinatorial Logic Contributions to the SEU Cross Section in 90 nm ASIC Technology

Hansen, David L., Miller, Eric J., Kleinosowski, Aj, Kohnen, Kirk, Le, Anthony, Wong, Dick, Amador, Karina, Baze, Mark, DeSalvo, David, Dooley, Maryanne, Gerst, Kenneth, Hughlock, Barrie, Jeppson, Bra

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 845 KB

english, 2009

26

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

Ahlbin, Jonathan R., Massengill, Lloyd W., Bhuva, Bharat L., Narasimham, Balaji, Gadlage, Matthew J., Eaton, Paul H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.08 MB

english, 2009

27

Junction Isolation Single Event Radiation Hardening of a 200 GHz SiGe:C HBT Technology Without Deep Trench Isolation

Diestelhorst, Ryan M., Phillips, Stanley D., Appaswamy, Aravind, Sutton, Akil K., Cressler, John D., Pellish, Jonath, Reed, Robert A., Vizkelethy, Gyorgy, Marshall, Paul W., Gustat, Hans, Heinemann, B

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.18 MB

english, 2009

28

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Sierawski, Brian D., Pellish, Jonathan A., Reed, Robert A., Schrimpf, Ronald D., Warren, Kevin M., Weller, Robert A., Mendenhall, Marcus H., Black, Jeffrey D., Tipton, Alan D., Xapsos, Michael A., Bau

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 870 KB

english, 2009

29

An Evaluation of An Ultralow Background Alpha-Particle Detector

Gordon, Michael S., Heidel, David F., Rodbell, Kenneth P., Dwyer-McNally, Brendan, Warburton, William K.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.22 MB

english, 2009

30

Optocouplers: Fundamentals and Hardness Assurance for Space Applications

Johnston, A. H., Harris, R. D., Miyahira, T. F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 215 KB

english, 2009

31

Single Crystal Growth, Optical Properties and Neutron Response of ${\rm Ce}^{3+}$ Doped ${\rm LiCaAlF}_{6}$

Yoshikawa, Akira, Yanagida, Takayuki, Yokota, Yuui, Kawaguchi, Noriaki, Ishizu, Sumito, Fukuda, Kentaro, Suyama, Toshihisa, Kim, Kyoung Jin, Pejchal, Jan, Nikl, Martin, Watanabe, Kenichi, Miyake, Masa

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 488 KB

english, 2009

32

Radiation Effects and Annealing Studies on Amorphous Silicon Solar Cells

Srour, Joseph R., Palko, James W., Lo, Daniel H., Liu, Simon H., Mueller, Robert L., Nocerino, John C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 503 KB

english, 2009

33

Gauss-Seidel Iterative Method as a Real-Time Pile-Up Solver of Scintillation Pulses

Novak, Roman, Vencelj, Matja¿

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 247 KB

english, 2009

34

Heavy Ion and High Energy Proton-Induced Single Event Transients in 90 nm Inverter, NAND and NOR Gates

Cannon, Ethan H., Cabanas-Holmen, Manuel

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.13 MB

english, 2009

35

Scintillation Properties and Time-Resolved Spectroscopy of a Novel Scintillator Material: Ce$^{3 +}$-Activated Li$_{3}$Lu(PO$_{4}$)$_{2}$ Crystals

Wisniewski, Dariusz, Boatner, Lynn A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.21 MB

english, 2009

36

Physics-Based Detection of Radioactive Contraband: A Sequential Bayesian Approach

Candy, J. V., Breitfeller, E., Guidry, B. L., Manatt, D., Sale, K., Chambers, D. H., Axelrod, M. A., Meyer, A. M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 2.23 MB

english, 2009

37

Development and Validation of a GATE Simulation Model for the LabPET Scanner

Rechka, Sanae, Fontaine, RÉjean, Rafecas, Magdalena, Lecomte, Roger

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.33 MB

english, 2009

38

A Bias-Dependent Single-Event Compact Model Implemented Into BSIM4 and a 90 nm CMOS Process Design Kit

Kauppila, Jeffrey S., Sternberg, Andrew L., Alles, Michael L., Francis, A. Matt, Holmes, Jim, Amusan, Oluwole A., Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 727 KB

english, 2009

39

Optimization Using Monte Carlo Calculations of a Bonner Sphere Spectrometer Extended to High Energies for the Neutron Environments Characterization

Serre, S., Castellani-Coulie, K., Paul, D., Lacoste, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 426 KB

english, 2009

40

Radiation Response of a Gate-All-Around Silicon Nano-Wire Transistor

Draper, Bruce, Okandan, Murat, Shaneyfelt, Marty

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.36 MB

english, 2009

41

Simulation of Silicon Photomultiplier Signals

Seifert, Stefan, van Dam, Herman T., Huizenga, Jan, Vinke, Ruud, Dendooven, Peter, Lohner, Herbert, Schaart, Dennis R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 709 KB

english, 2009

42

Soft-Error Rate in a Logic LSI Estimated From SET Pulse-Width Measurements

Makino, Takahiro, Kobayashi, Daisuke, Hirose, Kazuyuki, Takahashi, Daisuke, Ishii, Shigeru, Kusano, Masaki, Onoda, Shinobu, Hira, Toshio, Ohshima, Takeshi

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 345 KB

english, 2009

43

Validation of ${\rm K}$ and ${\rm L}$ Shell Radiative Transition Probability Calculations

Pia, Maria Grazia, Saracco, Paolo, Sudhakar, Manju

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 502 KB

english, 2009

44

Development of a Method for Passive Measurement of Radiation Doses at Ultra-High Dose Range

Obryk, Barbara, Bilski, Pawel, Budzanowski, Maciej, Fuerstner, Markus, Glaser, Maurice, Ilgner, Christoph J., Olko, Pawel, Pajor, Anna, Stuglik, Zofia

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 585 KB

english, 2009

45

Flash Memory

Oldham, Timothy R., Friendlich, M., Carts, M. A., Seidleck, C. M., LaBel, Kenneth A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 631 KB

english, 2009

46

Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs

Pellish, Jonathan A., Reed, Robert A., McMorrow, Dale, Vizkelethy, Gyorgy, Cavrois, Veronique Ferlet, Baggio, Jacques, Paillet, Philippe, Duhamel, Olivier, Moen, Kurt A., Phillips, Stanley D., Diestel

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 748 KB

english, 2009

47

The Random Telegraph Signal Behavior of Intermittently Stuck Bits in SDRAMs

Chugg, Andrew Michael, Burnell, Andrew J., Duncan, Peter H., Parker, Sarah, Ward, Jon

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 495 KB

english, 2009

48

Heavy Ion Testing and Single Event Upset Rate Prediction Considerations for a DICE Flip-Flop

Warren, Kevin M., Sternberg, Andrew L., Black, Jeffrey D., Weller, Robert A., Reed, Robert A., Mendenhall, Marcus H., Schrimpf, Ronald D., Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 576 KB

english, 2009

49

Investigation of the Energy Response of RADFET for High Energy Photons, Electrons, Protons, and Neutrons

Wind, Michael, Beck, Peter, Jaksic, Aleksandar

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 581 KB

english, 2009

50

Operational SER Calculations on the SAC-C Orbit Using the Multi-Scales Single Event Phenomena Predictive Platform (MUSCA ${\rm SEP}^{3}$)

Hubert, Guillaume, Duzellier, Sophie, Inguimbert, Christophe, Boatella-Polo, CÉsar, Bezerra, FranÇoise, Ecoffet, Robert

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.95 MB

english, 2009

51

Impact of Proton Irradiation-Induced Bulk Defects on Gate-Lag in GaN HEMTs

Kalavagunta, Aditya, Silvestri, M., Beck, M. J., Dixit, S. K., Schrimpf, Ronald D., Reed, R. A., Fleetwood, D. M., Shen, L., Mishra, U. K.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 474 KB

english, 2009

52

Characterization of Bulk and Surface Transport Mechanisms by Means of the Photocurrent Technique

Zanichelli, Massimiliano, Pavesi, Maura, Zappettini, Andrea, Marchini, Laura, Auricchio, Natalia, Caroli, Ezio, Manfredi, Manfredo

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 181 KB

english, 2009

53

A Technique for Measuring Dose Equivalent and Neutron Fluxes in Radiation Environments Using Silicon Diodes

Hands, Alex, Dyer, Clive

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 943 KB

english, 2009

54

Modeling the Dose Rate Response and the Effects of Hydrogen in Bipolar Technologies

Chen, X. Jie, Barnaby, Hugh J., Adell, Philippe, Pease, Ronald L., Vermeire, Bert, Holbert, Keith E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 554 KB

english, 2009

55

Radioactive Nuclei Induced Soft Errors at Ground Level

Wrobel, FrÉdÉric, Saigne, FrÉdÉric, Gedion, Michael, Gasiot, Jean, Schrimpf, Ronald D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 223 KB

english, 2009

56

A Novel Device Architecture for SEU Mitigation: The Inverse-Mode Cascode SiGe HBT

Phillips, Stanley D, Thrivikraman, Tushar, Appaswamy, Aravind, Sutton, Akil K., Cressler, John D., Vizkelethy, Gyorgy, Dodd, Paul, Reed, Robert A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.25 MB

english, 2009

57

SEU-Susceptibility of Logical Constants in Xilinx FPGA Designs

Quinn, Heather, Allen, Gregory R., Swift, Gary M., Tseng, Chen Wei, Graham, Paul S., Morgan, Keith Shearl, Ostler, Patrick

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 426 KB

english, 2009

58

Device Simulation of Monolithic Active Pixel Sensors: Radiation Damage Effects

Fourches, Nicolas T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 297 KB

english, 2009

59

The Effects of Nuclear Fragmentation Models on Single Event Effect Prediction

Clemens, Michael Andrew, Dodds, Nathaniel A., Weller, Robert A., Mendenhall, Marcus H., Reed, Robert A., Schrimpf, Ronald D., Koi, Tatsumi, Wright, Dennis H., Asai, Makoto

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 609 KB

english, 2009

60

Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits

Adell, Philippe C., Pease, Ronald L., Barnaby, Hugh J., Rax, Bernard, Chen, Xiao J., McClure, Steven S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 654 KB

english, 2009

61

Analysis of Single-Event Transients in Integer-$N$ Frequency Dividers and Hardness Assurance Implications for Phase-Locked Loops

Loveles, Thomas Daniel, Olson, Brian D., Bhuva, Bharat L., Holman, W. Timothy, Hafer, Craig C., Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 920 KB

english, 2009

62

Beam Dynamics in a 10-GeV Linear Accelerator for the X-Ray Free Electron Laser at PAL

Kim, Eun-San, Yoon, Moohyun

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.41 MB

english, 2009

63

Heavy-Ion-Induced Digital Single Event Transients in a 180 nm Fully Depleted SOI Process

Gadlage, Matthew J., Gouker, Pascale, Bhuva, Bharat L., Narasimham, Balaji, Schrimpf, Ronald D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 893 KB

english, 2009

64

The Effects of Aging and Hydrogen on the Radiation Response of Gated Lateral PNP Bipolar Transistors

Hughart, David. R., Schrimpf, Ronald D., Fleetwood, Daniel M., Chen, X. Jie, Barnaby, Hugh J., Holbert, Keith E., Pease, Ronald L., Platteter, Dale G., Tuttle, Blair R., Pantelides, Sokrates T.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 476 KB

english, 2009

65

Methodologies to Study Frequency-Dependent Single Event Effects Sensitivity in Flash-Based FPGAs

Battezzati, N., Gerardin, S., Manuzzato, A., Merodio, D., Paccagnella, A., Poivey, C., Sterpone, L., Violante, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 477 KB

english, 2009

66

Estimation of Cardiac Respiratory-Motion by Semi-Automatic Segmentation and Registration of Non-Contrast-Enhanced 4D-CT Cardiac Datasets

Dey, Joyoni, Pan, Tinsu, Choi, David J., Robotis, Dennis, Smyczynski, Mark S., Pretorius, P. Hendrik, King, Michael A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.08 MB

english, 2009

67

Performance of 8$\,\times\,$8 Pixel LaBr$_{3}$:Ce and Gd$_{2}$SiO$_{5}$:Ce Scintillator Arrays Coupled to a 64-Channel Multi-Anode PMT

Kurosawa, Shunsuke, Kubo, Hidetoshi, Hattori, Kaori, Ida, Chihiro, Iwaki, Satoru, Kabuki, Shigeto, Miuchi, Kentaro, Nishimura, Hironobu, Okada, Yoko, Parker, Joseph D., Takada, Atsushi, Takahashi, Mic

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.21 MB

english, 2009

68

Real-Life SEU Experiments on 90 nm SRAMs in Atmospheric Environment: Measures Versus Predictions Done by Means of ${\rm MUSCA~SEP}^{3}$ Platform

Peronnard, Paul, Velazco, Raoul, Hubert, Guillaume

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.05 MB

english, 2009

69

Evaluation of Floating Zone and Epitaxial Planar Silicon Detectors With Different Substrate Thickness After Irradiation up to $2\times 10^{16}$${\rm n}_{\rm eq}$ cm$^{- 2}$

Casse, Gianlu, Affolder, Antony, Allport, Philip P., Wormald, Michael

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 279 KB

english, 2009

70

Effect of Reactor Fuel Enrichment on Gamma Heating of Irradiated Samples

Varvayanni, Melpomeni, Savva, Panayiota, Catsaros, Nicolas, Antonopoulos-Domis, Michael

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 247 KB

english, 2009

71

TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation

Ladbury, Ray L., Benedetto, Joe, McMorrow, Dale, Buchner, Stephen P., Label, Kenneth A., Berg, Melanie D., Kim, Hak S., Sanders, Anthony B., Friendlich, Mark R., Phan, Anthony

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.61 MB

english, 2009

72

Circuit Modeling of Single-Event Transient Pulse Stretching in Digital CMOS

Tuinenga, Paul W., Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 457 KB

english, 2009

73

A GIOVE Derived Galileo Electron Spectrum and Comparison to Models

Taylor, B., Underwood, C. I., Ryden, K. A., Morris, P. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 974 KB

english, 2009

74

Fin-Width Dependence of Ionizing Radiation-Induced Subthreshold-Swing Degradation in 100-nm-Gate-Length FinFETs

El Mamouni, Farah, Zhang, En Xia, Schrimpf, Ronald D., Fleetwood, Daniel M., Reed, Robert A., Cristoloveanu, Sorin, Xiong, Weize

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 838 KB

english, 2009

75

Single-Event Transient Error Characterization of a Radiation-Hardened by Design 90 nm SerDes Transmitter Driver

Armstrong, S. E., Olson, B. D., Popp, J., Braatz, J., Loveless, T. D., Holman, W. T., McMorrow, D., Massengill, L. W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.07 MB

english, 2009

76

General Framework for Single Event Effects Rate Prediction in Microelectronics

Weller, Robert A., Reed, Robert A., Warren, Kevin M., Mendenhall, Marcus H., Sierawski, Brian D., Schrimpf, Ronald D., Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 357 KB

english, 2009

77

Simulation of Radiation Damage Effects on Planar Pixel Guard Ring Structure for ATLAS Inner Detector Upgrade

Benoit, Mathieu, Lounis, Abdenour, Dinu, Nicoleta

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.37 MB

english, 2009

78

Advances in Measuring and Modeling the Atmospheric Radiation Environment

Dyer, Clive, Hands, Alex, Lei, Fan, Truscott, Peter, Ryden, Keith A., Morris, Paul, Getley, Ian, Bennett, Les, Bennett, Bryce, Lewis, Brent

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.03 MB

english, 2009

79

Charge Trapping Properties of 3C- and 4H-SiC MOS Capacitors With Nitrided Gate Oxides

Arora, Rajan, Rozen, John, Fleetwood, Daniel M., Galloway, Kenneth F., Zhang, C. Xuan, Han, Jisheng, Dimitrijev, Sima, Kong, Fred, Feldman, Leonard C., Pantelides, Sokrates T., Schrimpf, Ronald D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 967 KB

english, 2009

80

On-Orbit Radiation Monitoring Using p-FET Dosimeter

Bogorad, Alexander L., Likar, Justin J., Wint, Jennifer L., Lombardi, Robert E., Herschitz, Roman

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 943 KB

english, 2009

81

The Use of a Dose-Rate Switching Technique to Characterize Bipolar Devices

Boch, JÉrÔme, Gonzalez Velo, Yago, Saigne, FrÉdÉric, Roche, Nicolas J.-H., Schrimpf, Ronald D., Vaille, Jean-Roch, Dusseau, Laurent, Chatry, Christian, Lorfevre, Eric, Ecoffet, Robert, Touboul, Antoin

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 520 KB

english, 2009

82

First Readout of a 64 $\times$ 64 DEPFET Matrix With VELA Circuit

Bombelli, Luca, Fiorini, Carlo, Ricca, Angelo Antonino, Porro, Matteo, Herrmann, Sven, Wassatsch, Andreas, Treis, Johannes, Lauf, Thomas, Lechner, Peter

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.10 MB

english, 2009

83

An Embeddable SOI Radiation Sensor

Shaneyfelt, Marty R., Hill, Tom A., Gurrieri, Thomas M., Schwank, James R., Flores, Richard S., Dodd, Paul E., Dalton, Scott M., Robinson, Alex

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 804 KB

english, 2009

84

A New Sum Trigger to Provide a Lower Energy Threshold for the MAGIC Telescope

Rissi, Michael, Otte, Nepomuk, Schweizer, Thomas, Shayduk, Maxim

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 697 KB

english, 2009

85

Development of a Versatile Test Platform for Single Event Effect (SEE) Characterization of Analog, Digital and Mixed-Signals Integrated Circuits (ICs)

Valsecchi, Nicolas, Gloutnay, Eric, Pellerin, Tony, Cusson, Jean-FranÇois, Lafrance, SÉbastien, Hardy, Julie, Brassard, Gilles

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.09 MB

english, 2009

86

The Effect of Re-Convergence on SER Estimation in Combinational Circuits

Biwei, Liu, Shuming, Chen, Bin, Liang, Zheng, Liu, Zhenyu, Zhao

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 464 KB

english, 2009

87

Design for Soft Error Resiliency in Internet Core Routers

Silburt, Allan L., Evans, Adrian, Perryman, Ian, Wen, Shi-Jie, Alexandrescu, Dan

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 480 KB

english, 2009

88

Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter

Kruckmeyer, Kirby, Prater, James S., Brown, Bill, DasGupta, Sandeepan

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 798 KB

english, 2009

89

Statistical Model Selection for TID Hardness Assurance

Ladbury, R., Gorelick, J. L., McClure, S. S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 372 KB

english, 2009

90

First Beam Test Characterisation of a 3D-stc Silicon Short Strip Detector

Pahn, Gregor, Bates, Richard, Boscardin, Maurizio, Dalla Betta, Gian-Franco, Eckert, Simon, Eklund, Lars, Fleta, Celeste, Jakobs, Karl, Kohler, Michael, Kuhn, Susanne, Parkes, Chris, Parzefall, Ulrich

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.00 MB

english, 2009

91

The Role of Irradiation Bias on the Time-Dependent Dielectric Breakdown of 130-nm MOSFETs Exposed to X-rays

Silvestri, Marco, Gerardin, Simone, Schrimpf, Ronald D., Fleetwood, Daniel M., Faccio, Federico, Paccagnella, Alessandro

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 223 KB

english, 2009

92

Single-Event Transients Effects on Dynamic Comparators in a 90 nm CMOS Triple-Well and Dual-Well Technology

Wang, Tao, Chen, Li, Dinh, Anh, Bhuva, Bharat

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 838 KB

english, 2009

93

The Effects of Elevated Temperature on Pulsed-Laser-Induced Single Event Transients in Analog Devices

Chen, Dakai, Buchner, Stephen P., Phan, Anthony M., Kim, Hak S., Sternberg, Andrew L., McMorrow, Dale, LaBel, Kenneth A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 956 KB

english, 2009

94

Comparison of Pixelated CdZnTe, CdTe and Si Sensors With the Simultaneously Counting and Integrating CIX Chip

Fink, Johannes, Kraft, Edgar, Kruger, Hans, Wermes, Norbert, Engel, Klaus JÜrgen, Herrmann, Christoph

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 623 KB

english, 2009

95

Significance of Strike Model in Circuit-Level Prediction of Charge Sharing Upsets

Francis, A. Matt, Dimitrov, Dimitre, Kauppila, Jeff, Sternberg, Andrew, Alles, Michael, Holmes, James, Mantooth, H. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 630 KB

english, 2009

96

Measurement of the Current Related Damage Rate at ${-}50^\circ$C and Consequences on Macropixel Detector Operation in Space Experiments

Segneri, Gabriele, Brown, Craig, Carpenter, James-D., Kuhnle, Bernd, Lauf, Thomas, Lechner, Peter, Lutz, Gerhard, Rummel, Stefan, Struder, Lothar, Treis, Johannes, Whitford, Chris

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 300 KB

english, 2009

97

Error Instability in Floating Gate Flash Memories Exposed to TID

Bagatin, Marta, Gerardin, Simone, Cellere, Giorgio, Paccagnella, Alessandro, Visconti, Angelo, Bonanomi, Mauro, Beltrami, Silvia

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 381 KB

english, 2009

98

Determination of the Charge Collection Efficiency in Neutron Irradiated Silicon Detectors

Petterson, M. K., Hurley, R. F., Arya, K., Betancourt, C., Bruzzi, M., Colby, B., Gerling, M., Meyer, C., Pixley, J., Rice, T., Sadrozinski, H. F.-W., Scaringella, M., Bernardini, J., Borrello, L., Fi

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 335 KB

english, 2009

99

Modeling of Alpha-Induced Single Event Upsets for 45 nm Node SOI Devices Using Realistic C4 and 3D Circuit Geometries

Tang, Henry H. K., Murray, Conal E., Fiorenza, Giovanni, Rodbell, Kenneth P., Heidel, David F.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 353 KB

english, 2009

100

A Mechanism Versus SEU Impact Analysis of Collector Charge Collection in SiGe HBT Current Mode Logic

Zhang, Tong, Wei, Xiaoyun, Niu, Guofu, Cressler, John D., Marshall, Paul W., Reed, Robert A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.11 MB

english, 2009

101

Dosimetric Systems and Characteristics of CR-39 for Use in Individual Neutron Monitoring

Rohatgi Pal, Rupali, Jayalakshmi, V., Sathian, Deepa, Chaurasiya, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 303 KB

english, 2009

102

Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits

Wissel, Larry, Heidel, David F., Gordon, Michael S., Rodbell, Kenneth P., Stawiasz, Kevin, Cannon, Ethan H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 268 KB

english, 2009

103

Time Series Evaluation of Radiation Portal Monitor Data for Point Source Detection

Robinson, Sean M., Bender, Sarah E., Flumerfelt, Eric L., LoPresti, Charles A., Woodring, Mitchell L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 868 KB

english, 2009

104

Laser-Induced Current Transients in Strained-Si Diodes

Park, Hyunwoo, Cummings, Daniel J., Arora, Rajan, Pellish, Jonathan A., Reed, Robert A., Schrimpf, Ronald D., McMorrow, Dale, Armstrong, Sarah E., Roh, Ukjin, Nishida, Toshikazu, Law, Mark E., Thompso

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 954 KB

english, 2009

105

Single Event Transient Response of SiGe Voltage References and Its Impact on the Performance of Analog and Mixed-Signal Circuits

Najafizadeh, Laleh, Phillips, Stanley D., Moen, Kurt A., Diestelhorst, Ryan M., Bellini, Marco, Saha, Prabir K., Cressler, John D., Vizkelethy, Gyorgy, Turowski, Marek, Raman, Ashok, Marshall, Paul W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.51 MB

english, 2009

106

2009 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman

Ferlet-Cavrois, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 38 KB

english, 2009

107

In memoriam: Jean-Claude Boudenot (1956-2008)

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 169 KB

english, 2009

108

2009 Special NSREC Issue of the IEEE Transactions on Nuclear Science Comments by the Editors

Schwank, Jim, Marshall, Paul, Brown, Dennis, Poivey, Christian, Pease, Ron, Girard, Sylvain, Reed, Robert

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 23 KB

english, 2009

109

Editorial Conference Comments by the General Chairman

Hopkins, Mark A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 54 KB

english, 2009

110

Outstanding Conference Paper Award 2009 IEEE Nuclear and Space Radiation Effects Conference

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.01 MB

english, 2009

111

IEEE Transactions on Nuclear Science publication information

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 39 KB

english, 2009

112

IEEE Transactions on Nuclear Science information for authors

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 31 KB

english, 2009

113

Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society [advertisement]

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IEEE Transactions on Nuclear Science

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2009

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english

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PDF, 18 KB

english, 2009

114

Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society [advertisement]

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IEEE Transactions on Nuclear Science

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2009

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PDF, 18 KB

2009

115

Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society [advertisement]

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IEEE Transactions on Nuclear Science

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2009

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english

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PDF, 18 KB

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116

HX-POL—A Balloon-Borne Hard X-Ray Polarimeter

Krawczynski, H., Garson III, A., Martin, J., Li, Q., Beilicke, M., Dowkontt, P., Lee, K., Wulf, E., Kurfess, J., Novikova, E. I., De Geronimo, G., Baring, M. G., Harding, A. K., Grindlay, J., Hong, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 426 KB

english, 2009

117

IEEE Transactions on Nuclear Science publication information

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 39 KB

english, 2009

118

2009 December Special NSREC Issue of the IEEE Transactions on Nuclear Science List of Reviewers

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 22 KB

english, 2009

119

Conference Author Index

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

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PDF, 30 KB

english, 2009

120

Table of contents

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

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PDF, 90 KB

english, 2009

121

2009 Index IEEE Transactions on Nuclear Science Vol. 56

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

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PDF, 1.21 MB

english, 2009

122

Why we joined ... [advertisement]

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IEEE Transactions on Nuclear Science

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2009

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2009

123

Table of contents

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IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

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PDF, 103 KB

english, 2009

124

frontcover

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

File:

PDF, 64 KB

2009