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Let spectra of proton energy levels from 50 to 500 mev and their effectiveness for single event effects characterization of microelectronics
Hiemstra, D.M., Blackmore, E.W.Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.821811
Date:
December, 2003
File:
PDF, 401 KB
english, 2003