Counterdoped Pocket Thickness Optimization of Gate-on-Source-Only Tunnel FETs
Kao, Kuo-Hsing, Verhulst, Anne S., Vandenberghe, William G., De Meyer, KristinVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2012.2227115
Date:
January, 2013
File:
PDF, 872 KB
english, 2013