Volume 60; Issue 1

IEEE Transactions on Electron Devices

Volume 60; Issue 1

1

Cu Interconnect Limitations and Opportunities for SWNT Interconnects at the End of the Roadmap

Ceyhan, Ahmet, Naeemi, Azad

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.25 MB

english, 2013

2

Control of Resistance by Oxide on the Surface of Cu Interconnects With CuSiN and Ti-based Barrier Metal

Hayashi, Yumi, Matsunaga, Noriaki, Wada, Makoto, Nakao, Shinichi, Watanabe, Kei, Kato, Satoshi, Sakata, Atsuko, Kajita, Akihiro, Shibata, Hideki

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 963 KB

english, 2013

3

Demonstration of a Subthreshold FPGA Using Monolithically Integrated Graphene Interconnects

Lee, Kyeong-Jae, Park, Hyesung, Kong, Jing, Chandrakasan, Anantha P.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.41 MB

english, 2013

4

On the Variability of the Front-/Back-Channel LF Noise in UTBOX SOI nMOSFETs

dos Santos, Sara D., Nicoletti, Talitha, Martino, João Antonio, Aoulaiche, Marc, Veloso, Anabela, Jurczak, Malgorzata, Simoen, Eddy, Claeys, Cor

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.49 MB

english, 2013

5

Characterization and Modeling of Cryogenic Ultralow-Noise InP HEMTs

Schleeh, J., Rodilla, H., Wadefalk, N., Nilsson, P., Grahn, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 980 KB

english, 2013

6

Fixed-Pattern-Noise Correction for an Integrating Wide-Dynamic-Range CMOS Image Sensor

Das, Dipayan, Collins, Steve

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 301 KB

english, 2013

7

Analysis of Gated CMOS Image Sensor for Spatial Filtering

Spivak, Arthur, Belenky, Alexander, Fish, Alexander, Yadid-Pecht, Orly

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.23 MB

english, 2013

8

Improved Subthreshold and Output Characteristics of Source-Pocket Si Tunnel FET by the Application of Laser Annealing

Chang, Hsu-Yu, Adams, Bruce, Chien, Po-Yen, Li, Jiping, Woo, Jason C. S.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 671 KB

english, 2013

9

Counterdoped Pocket Thickness Optimization of Gate-on-Source-Only Tunnel FETs

Kao, Kuo-Hsing, Verhulst, Anne S., Vandenberghe, William G., De Meyer, Kristin

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 872 KB

english, 2013

10

Design Optimization of Multigate Bulk MOSFETs

Ho, Byron, Sun, Xin, Shin, Changhwan, Liu, Tsu-Jae King

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 830 KB

english, 2013

11

Field-Emission Characteristics of Selectively Grown CNTs

Tsai, Chung-Nan, Kirkici, Hulya

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 579 KB

english, 2013

12

High-Power Tunable Terahertz Radiation by High-Order Harmonic Generation

Gong, Huarong, Travish, Gil, Xu, Jin, Wei, Yanyu, Feng, Jinjun, Gong, Yubin

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 649 KB

english, 2013

13

High-Power Copper Gratings for a Sheet-Beam Traveling-Wave Amplifier at G-band

Joye, Colin D., Calame, Jeffrey P., Cook, Alan M., Garven, Morag

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 548 KB

english, 2013

14

Comparison of Interfacial and Bulk Ionic Motion in Analog Memristors

Greenlee, Jordan D., Calley, W. Laws, Moseley, Michael W., Doolittle, W. Alan

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 437 KB

english, 2013

15

Fabrication and Electrical Characterization of Fully CMOS-Compatible Si Single-Electron Devices

Koppinen, P. J., Stewart, M. D., Zimmerman, Neil M.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 824 KB

english, 2013

16

An Investigation on the Optimization and Scaling of Complementary SiGe HBTs

Chakraborty, P. S., Moen, K. A., Cressler, J. D.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.17 MB

english, 2013

17

The Impact of Bias Conditions on Self-Heating in AlGaN/GaN HEMTs

Choi, Sukwon, Heller, Eric R., Dorsey, Donald, Vetury, Ramakrishna, Graham, Samuel

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 382 KB

english, 2013

18

High-Power Millimeter-Wave BWO Driven by Sheet Electron Beam

Wang, Zhanliang, Gong, Yubin, Wei, Yanyu, Duan, Zhaoyun, Zhang, Yabin, Yue, Linna, Gong, Huarong, Yin, Hairong, Lu, Zhigang, Xu, Jin, Feng, Jinjun

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.85 MB

english, 2013

19

Analysis of the GaAs/GaAsBi Material System for Heterojunction Bipolar Transistors

Marks, Zefram D., Haygood, Ian W., Van Zeghbroeck, Bart

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 392 KB

english, 2013

20

Enhanced AlGaN/GaN MOS-HEMT Performance by Using Hydrogen Peroxide Oxidation Technique

Liu, Han-Yin, Chou, Bo-Yi, Hsu, Wei-Chou, Lee, Ching-Sung, Sheu, Jinn-Kong, Ho, Chiu-Sheng

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.33 MB

english, 2013

21

Comparison of SRAM Cells for 10-nm SOI FinFETs Under Process and Environmental Variations

Jaksic, Zoran, Canal, Ramon

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.10 MB

english, 2013

22

SiGe Channel Technology: Superior Reliability Toward Ultrathin EOT Devices—Part I: NBTI

Franco, Jacopo, Kaczer, Ben, Roussel, Philippe J., Mitard, Jérôme, Cho, Moonju, Witters, Liesbeth, Grasser, Tibor, Groeseneken, Guido

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.39 MB

english, 2013

23

Fabrication of $\hbox{Si}_{1 - x}\hbox{Ge}_{x}/\hbox{Si}$ pMOSFETs Using Corrugated Substrates for Improved $I_{\rm ON}$ and Reduced Layout-Width Dependence

Ho, Byron, Xu, Nuo, Wood, Bingxi, Tran, Vinh, Chopra, Saurabh, Kim, Yihwan, Nguyen, Bich-Yen, Bonnin, Olivier, Mazure, Carlos, Kuppurao, Satheesh, Chang, Chorng-Ping, Liu, Tsu-Jae King

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.63 MB

english, 2013

24

Improved Efficiency of Backward-Wave Oscillator With an Inclined Electron Beam

Sattorov, Matlabjon, Khutoryan, Eduard, Lukin, Konstantin, Kwon, Ohjoon, Park, Gun-Sik

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 851 KB

english, 2013

25

Nanodiamond Vacuum Field Emission Integrated Differential Amplifier

Hsu, Shao-Hua, Kang, Weng Poo, Davidson, Jimmy L., Huang, Jin H., Kerns, David V.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.06 MB

english, 2013

26

Performance Comparison of Conventional and Inverted Organic Bulk Heterojunction Solar Cells From Optical and Electrical Aspects

Chen, Dazheng, Zhang, Chunfu, Wang, Zhizhe, Zhang, Jincheng, Feng, Qian, Xu, Shengrui, Zhou, Xiaowei, Hao, Yue

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 605 KB

english, 2013

27

Photoelectrical and Low-Frequency Noise Characteristics of ZnO Nanorod Photodetectors Prepared on Flexible Substrate

Chen, T. P., Young, S. J., Chang, S. J., Hsiao, C. H., Wu, S. L.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 871 KB

english, 2013

28

Micromachined Passive Bandpass Filters Based on GaAs Monolithic-Microwave-Integrated-Circuit Technology

Zhiqiang Zhang,, Xiaoping Liao,

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1000 KB

english, 2013

29

Physical Modeling of the Capacitance and Capacitive Coupling Noise of Through-Oxide Vias in FDSOI-Based Ultra-High Density 3-D ICs

Xu, Chuan, Banerjee, Kaustav

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.21 MB

english, 2013

30

Fabrication and Characterization of High-Mobility Solution-Based Chalcogenide Thin-Film Transistors

Mejia, Israel, Salas-Villasenor, Ana L., Cha, Dongkyu, Alshareef, Husam N., Gnade, Bruce E., Quevedo-Lopez, Manuel A.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 758 KB

english, 2013

31

FEM Model of Wraparound CNTFET With Multi-CNT and Its Capacitance Modeling

Akanda, Md. Rakibul Karim, Khosru, Quazi D. M.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 495 KB

english, 2013

32

Enhancing Frequency-Tuning Ability of an Improved Relativistic Backward-Wave Oscillator

Song, Wei, Zhang, Xiaowei, Chen, Changhua, Sun, Jun, Song, Zhimin

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 531 KB

english, 2013

33

A Parametric Study of InGaN/GaN Nanorod Core-Shell LEDs

Auf der Maur, Matthias, Sacconi, Fabio, Di Carlo, Aldo

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 983 KB

english, 2013

34

Coupling Mechanisms and Effects Between On-Chip Antenna and Inductor or Coplanar Waveguide

Deng, Tianwei, Chen, Zhiming, Zhang, Y. P.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.01 MB

english, 2013

35

Bipolar Poisson Solution for Independent Double-Gate MOSFET

Abraham, Aby, Thakur, Pankaj Kumar, Mahapatra, Santanu

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 206 KB

english, 2013

36

High-$Q$ Backside Silicon-Embedded Inductor for Power Applications in $\mu\hbox{H}$ and MHz Range

Wu, Rongxiang, Sin, Johnny K. O., Yue, C. Patrick

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 589 KB

english, 2013

37

Charge Distribution and Contact Resistance Model for Coplanar Organic Field-Effect Transistors

Kim, Chang Hyun, Bonnassieux, Yvan, Horowitz, Gilles

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 973 KB

english, 2013

38

Orientational Dependence in Device Performances of InAs and Si Nanowire MOSFETs Under Ballistic Transport

Shimoida, K., Yamada, Y., Tsuchiya, H., Ogawa, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.04 MB

english, 2013

39

Transport Gap in Dual-Gated Graphene Bilayers Using Oxides as Dielectrics

Kayoung Lee,, Fallahazad, B., Hongki Min,, Tutuc, E.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 723 KB

english, 2013

40

Threshold Voltage Design and Performance Assessment of Hetero-Channel SRAM Cells

Hu, Vita Pi-Ho, Fan, Ming-Long, Su, Pin, Chuang, Ching-Te

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.30 MB

english, 2013

41

Suppression of Drain-Induced Barrier Lowering in Silicon-on-Insulator MOSFETs Through Source/Drain Engineering for Low-Operating-Power System-on-Chip Applications

Yamada, Tatsuya, Nakajima, Yoshikata, Hanajiri, Tatsuro, Sugano, Takuo

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.23 MB

english, 2013

42

Design of Novel 300-V Field-MOS FETs With Low on-Resistance for Analog Switch Circuits

Miyoshi, Tomoyuki, Tominari, Tatsuya, Hayashi, Yoshihiro, Yoshinaga, Masaki, Oshima, Takayuki, Wada, Shinichiro, Noguchi, Junji

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.99 MB

english, 2013

43

Subthreshold Analog/RF Performance Enhancement of Underlap DG FETs With High- $k$ Spacer for Low Power Applications

Koley, Kalyan, Dutta, Arka, Syamal, Binit, Saha, Samar K., Sarkar, Chandan Kumar

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.68 MB

english, 2013

44

High-Performance p-Channel LDMOS Transistors and Wide-Range Voltage Platform Technology Using Novel p-Channel Structure

Shimamoto, Satoshi, Yanagida, Yohei, Shirakawa, Shinji, Miyakoshi, Kenji, Oshima, Takayuki, Sakano, Junichi, Wada, Shinichiro, Noguchi, Junji

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.53 MB

english, 2013

45

Complementary Switching in Oxide-Based Bipolar Resistive-Switching Random Memory

Nardi, Federico, Balatti, Simone, Larentis, Stefano, Gilmer, David C., Ielmini, Daniele

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.33 MB

english, 2013

46

A Novel Compact High-Voltage LDMOS Transistor Model for Circuit Simulation

Shi, Longxing, Jia, Kan, Sun, Weifeng

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 385 KB

english, 2013

47

Characterization of Thermoelectric Properties of Heavily Doped n-Type Polycrystalline Silicon Carbide Thin Films

Lei, Man I, Mehregany, Mehran

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 544 KB

english, 2013

48

Stochastic Variability in Silicon Double-Gate Lateral Tunnel Field-Effect Transistors

Leung, Greg, Chui, Chi On

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 975 KB

english, 2013

49

High-Performance Solution-Processed ZrInZnO Thin-Film Transistors

Tue, Phan Trong, Miyasako, Takaaki, Li, Jinwang, Tu, Huynh Thi Cam, Inoue, Satoshi, Tokumitsu, Eisuke, Shimoda, Tatsuya

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.05 MB

english, 2013

50

Very Large Current Modulation in Vertical Heterostructure Graphene/hBN Transistors

Fiori, Gianluca, Bruzzone, Samantha, Iannaccone, Giuseppe

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 493 KB

english, 2013

51

Direct Band-to-Band Tunneling in Reverse Biased $ \hbox{MoS}_{2}$ Nanoribbon p-n Junctions

Ghosh, Ram Krishna, Mahapatra, Santanu

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.16 MB

english, 2013

52

Contact-Induced Negative Differential Resistance in Short-Channel Graphene FETs

Grassi, Roberto, Low, Tony, Gnudi, Antonio, Baccarani, Giorgio

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.19 MB

english, 2013

53

Revisited RF Compact Model of Gate Resistance Suitable for High- $K$/Metal Gate Technology

Dormieu, Benjamin, Scheer, Patrick, Charbuillet, Clément, Jaouen, Hervé, Danneville, François

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.18 MB

english, 2013

54

$\hbox{Al}_{2}\hbox{O}_{3}$ Interface Engineering of Germanium Epitaxial Layer Grown Directly on Silicon

Tan, Yew Heng, Yew, Kwang Sing, Lee, Kwang Hong, Chang, Yao-Jen, Chen, Kuan-Neng, Ang, Diing Shenp, Fitzgerald, Eugene A., Tan, Chuan Seng

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.01 MB

english, 2013

55

Narrow-Width Effect on High-Frequency Performance and RF Noise of Sub-40-nm Multifinger nMOSFETs and pMOSFETs

Kuo-Liang Yeh,, Jyh-Chyurn Guo,

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 758 KB

english, 2013

56

InP DHBTs Having Lateral and Sidewall Collector Schottky Contacts

Cohen-Elias, D., Gavrilov, A., Cohen, S., Kraus, S., Ritter, D.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 2.13 MB

english, 2013

57

Position-Dependent Bulk Traps and Carrier Compensation in 4H-SiC Bipolar Junction Transistors

Usman, Muhammad, Nawaz, Muhammad, Hallen, Anders

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 575 KB

english, 2013

58

Impact of Buffer Layer on Atomic Layer Deposited TiAlO Alloy Dielectric Quality for Epitaxial-GaAs/Ge Device Application

Dalapati, G. K., Chia, C. K., Mahata, C., Krishnamoorthy, S., Tan, C. C., Tan, H. R., Maiti, Chinmay Kumar, Chi, Dongzhi

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.89 MB

english, 2013

59

Analysis of Contributing Factors for Determining the Reliability Characteristics of GaN-Based White Light-Emitting Diodes With Dual Degradation Kinetics

Jung, Eunjin, Kim, Min Soo, Kim, Hyunsoo

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.20 MB

english, 2013

60

Junction-Temperature Determination in InGaN Light-Emitting Diodes Using Reverse Current Method

Wu, Biqing, Lin, Siqi, Shih, Tien-Mo, Gao, Yulin, Lu, Yijun, Zhu, Lihong, Chen, Guolong, Chen, Zhong

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 452 KB

english, 2013

61

Impact of Moisture From Passivation on Endurance and Retention of NAND Flash Memory

Zih-Song Wang,, Te-Yuan Yin,, Tzung-Hua Ying,, Ya-Jui Lee,, Chieh-Yi Lu,, Arakawa, H., Chrong Jung Lin,

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.53 MB

english, 2013

62

Specifications of Nanoscale Devices and Circuits for Neuromorphic Computational Systems

Rajendran, Bipin, Liu, Yong, Seo, Jae-sun, Gopalakrishnan, Kailash, Chang, Leland, Friedman, Daniel J., Ritter, Mark B.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 657 KB

english, 2013

63

A Self-Consistent Electrothermal Model for Analyzing NBTI Effect in p-Type Poly-Si Thin-Film Transistors

Ho, Chih-Hsiang, Panagopoulos, Georgios, Roy, Kaushik

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.16 MB

english, 2013

64

$\hbox{In}_{0.5}\hbox{Ga}_{0.5}\hbox{As}$-Based Metal–Oxide–Semiconductor Capacitor on GaAs Substrate Using Metal–Organic Chemical Vapor Deposition

Nguyen, H. Q., Trinh, H. D., Chang, E. Y., Lee, C. T., Wang, Shin Yuan, Yu, H. W., Hsu, C. H., Nguyen, C. L.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 779 KB

english, 2013

65

Degradation of Polycrystalline Silicon TFT CMOS Inverters under AC Operation

Chen, Wei, Wang, Mingxiang, Zhou, Yan, Wong, Man

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 853 KB

english, 2013

66

Application of MgCaO Cathode Layer to Plasma Display Panel for High Luminous Efficacy

Lee, Tae-Ho, Cheong, Hee-Woon, Kwon, Ohyung, Whang, Ki-Woong

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 764 KB

english, 2013

67

Color-Tunable and Phosphor-Free White-Light Multilayered Light-Emitting Diodes

Cheung, Y. F., Choi, H. W.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.03 MB

english, 2013

68

Numerical Evaluation of 10-kV Clustered Insulated Gate Bipolar Transistor in 4H-SiC

Menon, K. G., Narayanan, Ekkanath Madathil Sankara

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.99 MB

english, 2013

69

Self-Selection Unipolar $\hbox{HfO}_{x}$ -Based RRAM

Tran, X. A., Zhu, W., Liu, W. J., Yeo, Y. C., Nguyen, B. Y., Yu, H. Y.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.00 MB

english, 2013

70

Dependence of Read Margin on Pull-Up Schemes in High-Density One Selector–One Resistor Crossbar Array

Lo, Chun-Li, Hou, Tuo-Hung, Chen, Mei-Chin, Huang, Jiun-Jia

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.10 MB

english, 2013

71

SiGe Channel Technology: Superior Reliability Toward Ultra-Thin EOT Devices—Part II: Time-Dependent Variability in Nanoscaled Devices and Other Reliability Issues

Franco, Jacopo, Kaczer, Ben, Toledano-Luque, María, Roussel, Philippe J., Kauerauf, Thomas, Mitard, Jérôme, Witters, Liesbeth, Grasser, Tibor, Groeseneken, Guido

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.12 MB

english, 2013

72

New Insights Into Defect Loss, Slowdown, and Device Lifetime Enhancement

Meng Duan,, Jian Fu Zhang,, Zhigang Ji,, Wei Dong Zhang,, Kaczer, B., De Gendt, S., Groeseneken, G.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1003 KB

english, 2013

73

Electrical Resistivity of Liquid $\hbox{Ge}_{2} \hbox{Sb}_{2}\hbox{Te}_{5}$ Based on Thin-Film and Nanoscale Device Measurements

Cil, Kadir, Dirisaglik, Faruk, Adnane, Lhacene, Wennberg, Maren, King, Adrienne, Faraclas, Azer, Akbulut, Mustafa B., Zhu, Yu, Lam, Chung, Gokirmak, Ali, Silva, Helena

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1020 KB

english, 2013

74

Forming Kinetics in $\hbox{HfO}_{2}$ -Based RRAM Cells

Lorenzi, Paolo, Rao, Rosario, Irrera, Fernanda

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 748 KB

english, 2013

75

The Design and Fabrication of Carbon-Nanotube-Based Field Emission X-Ray Cathode With Ballast Resistor

Sun, Yonghai, Jaffray, David A., Yeow, John T. W.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 749 KB

english, 2013

76

Errata to “Piecewise Linearization Technique for Compact Charge Modeling of Independent DG MOSFET” [Jul 12 1974-1979]

Jandhyala, Srivatsava, Abraham, Aby, Anghel, Costin, Mahapatra, Santanu

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 45 KB

english, 2013

77

Electron Transport in InAsSb-Based nBn Photodetector Structures

Umana-Membreno, G. A., Klein, B., Smith, E. P. G., Antoszewski, J., Plis, E., Johnson, S. M., Krishna, S., Rhiger, D. R., Faraone, L.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 470 KB

english, 2013

78

Physics-Based Solution for Electrical Resistance of Graphene Under Self-Heating Effect

Verma, Rekha, Bhattacharya, Sitangshu, Mahapatra, Santanu

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 235 KB

english, 2013

79

Operating Voltage Constraints in 45-nm SOI nMOSFETs and Cascode Cores

Arora, Rajan, Cressler, John D.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.58 MB

english, 2013

80

IEEE Transactions on Electron Devices publication information

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 151 KB

english, 2013

81

Special Issue on GaN Electronic Devices

Journal:

IEEE Transactions on Electron Devices

Year:

2013

File:

PDF, 411 KB

2013

82

Table of contents

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 75 KB

english, 2013

83

T-ED Retiring Editors

Cressler, John D.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 19 KB

english, 2013

84

Welcome to a New T-ED Editor

Cressler, John D.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 43 KB

english, 2013

85

IEEE Transactions on Electron Devices information for authors

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 103 KB

english, 2013

86

Blank page

Journal:

IEEE Transactions on Electron Devices

Year:

2013

File:

PDF, 5 KB

2013

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