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Impact of illumination level and oxide parameters on Shockley–Read–Hall recombination at the Si‐SiO2 interface
Aberle, Armin G., Glunz, Stefan, Warta, WilhelmVolume:
71
Year:
1992
Language:
english
DOI:
10.1063/1.350782
File:
PDF, 1.31 MB
english, 1992