A Rigorous Classical Solution for the Drain Current of...

IEEE Transactions on Electron Devices 2012 / 09 Vol. 59; Iss. 9

A Rigorous Classical Solution for the Drain Current of Doped Symmetric Double-Gate MOSFETs

Ortiz-Conde, Adelmo, Garcia-Sanchez, Francisco J.
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2012.2204061
Date:
September, 2012
File:
PDF, 938 KB
english, 2012
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