A novel method to characterize MOS transistors with mixed...

IEEE Transactions on Electron Devices 1992 Vol. 39; Iss. 3

A novel method to characterize MOS transistors with mixed gate dielectric technologies

Siergiej, R.R., White, M.H.
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Volume:
39
Year:
1992
Language:
english
DOI:
10.1109/16.123502
File:
PDF, 437 KB
english, 1992
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