Efficiently analyzing the impact of aging effects on large...

Efficiently analyzing the impact of aging effects on large integrated circuits

Dominik Lorenz, Martin Barke, Ulf Schlichtmann
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Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2011.12.029
File:
PDF, 471 KB
english, 2012
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