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Volume 52; Issue 8
Main
Microelectronics Reliability
Volume 52; Issue 8
Microelectronics Reliability
Volume 52; Issue 8
1
Reliability optimization of analog integrated circuits considering the trade-off between lifetime and area
Xin Pan
,
Helmut Graeb
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 454 KB
Your tags:
english, 2012
2
Ensuring accuracy in optical and electrical measurement of ultra-bright LEDs during reliability test
Sihan Joseph Chen
,
Cher Ming Tan
,
Boon Khai Eric Chen
,
Zhi Yong Shaun Chua
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 774 KB
Your tags:
english, 2012
3
Influence of multi-finger layout on the subthreshold behavior of nanometer MOS transistors
S.-L. Siu
,
W.-S. Tam
,
H. Wong
,
C.-W. Kok
,
K. Kakusima
,
H. Iwai
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 690 KB
Your tags:
english, 2012
4
Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing
J. Liu
,
H. Wong
,
S.L. Siu
,
C.W. Kok
,
V. Filip
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 569 KB
Your tags:
english, 2012
5
Applications of finite element methods for reliability study of ULSI interconnections
Cher Ming Tan
,
Wei Li
,
Zhenghao Gan
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.21 MB
Your tags:
english, 2012
6
A novel gate-suppression technique for ESD protection
Meng Miao
,
Shurong Dong
,
Mingliang Li
,
Jian Wu
,
Fei Ma
,
Jianfeng Zheng
,
Yan Han
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 697 KB
Your tags:
english, 2012
7
Interconnect reliability dependence on fast diffusivity paths
Hajdin Ceric
,
Roberto Lacerda de Orio
,
Siegfried Selberherr
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 903 KB
Your tags:
english, 2012
8
Optimizing the fabrication process for high performance graphene field effect transistors
Yanjie Wang
,
Bo-Chao Huang
,
Ming Zhang
,
Jason C.S. Woo
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 613 KB
Your tags:
english, 2012
9
Improving the electrical characteristics of MOS transistors with CeO2/La2O3 stacked gate dielectric
B.L. Yang
,
H. Wong
,
K. Kakushima
,
H. Iwai
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 545 KB
Your tags:
english, 2012
10
Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress
M. Meneghini
,
M. Dal Lago
,
L. Rodighiero
,
N. Trivellin
,
E. Zanoni
,
G. Meneghesso
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 519 KB
Your tags:
english, 2012
11
A novel power-clamp assisted complementary MOSFET for robust ESD protection
Jian Wu
,
Shurong Dong
,
Mingliang Li
,
Meng Miao
,
Fei Ma
,
Jianfeng Zheng
,
Yan Han
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 484 KB
Your tags:
english, 2012
12
Charge storage and data retention characteristics of forming gas-annealed Gd2O3-nanocrystal nonvolatile memory cell
Jer-Chyi Wang
,
Chih-Ting Lin
,
Chi-Hsien Huang
,
Chao-Sung Lai
,
Chin-Hsiang Liao
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 726 KB
Your tags:
english, 2012
13
Modeling of terminal ring structures for high-voltage power MOSFETs
Wing-Shan Tam
,
Sik-Lam Siu
,
Oi-Ying Wong
,
Chi-Wah Kok
,
Hei Wong
,
V. Filip
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 618 KB
Your tags:
english, 2012
14
Simulation study of Insulated Shallow Extension Silicon On Nothing (ISESON) MOSFET for high temperature applications
Vandana Kumari
,
Manoj Saxena
,
R.S. Gupta
,
Mridula Gupta
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 343 KB
Your tags:
english, 2012
15
Including spatial correlations of channel length and threshold voltage variation in circuit simulations
Josef Watts
,
Henry Trombley
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.06 MB
Your tags:
english, 2012
16
pH sensing reliability of flexible ITO/PET electrodes on EGFETs prepared by a roll-to-roll process
Cheng-En Lue
,
I-Shun Wang
,
Chi-Hsien Huang
,
Yu-Ting Shiao
,
Hau-Cheng Wang
,
Chia-Ming Yang
,
Shu-Hao Hsu
,
Ching-Yu Chang
,
William Wang
,
Chao-Sung Lai
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 582 KB
Your tags:
english, 2012
17
Effect of IC layout on the reliability of CMOS amplifiers
Feifei He
,
Cher Ming Tan
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.70 MB
Your tags:
english, 2012
18
Investigation of ESD protection strategy in high voltage Bipolar–CMOS–DMOS process
Fei Ma
,
Yan Han
,
Shurong Dong
,
Meng Miao
,
Jianfeng Zheng
,
Jian Wu
,
Cheng-gong Han
,
Kehan Zhu
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.18 MB
Your tags:
english, 2012
19
An accurate MOSFET aging model for 28 nm integrated circuit simulation
Bogdan Tudor
,
Joddy Wang
,
Zhaoping Chen
,
Robin Tan
,
Weidong Liu
,
Frank Lee
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 826 KB
Your tags:
english, 2012
20
Fault detection in resistive ladder network with minimal measurements
S.B. Shashank
,
Mohd Wajid
,
Satyam Mandavalli
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 652 KB
Your tags:
english, 2012
21
Experimental characterization and modelling of electromigration lifetime under unipolar pulsed current stress
Meng Keong Lim
,
Jingyuan Lin
,
Yong Chiang Ee
,
Chee Mang Ng
,
Jun Wei
,
Chee Lip Gan
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1014 KB
Your tags:
english, 2012
22
Efficiently analyzing the impact of aging effects on large integrated circuits
Dominik Lorenz
,
Martin Barke
,
Ulf Schlichtmann
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 471 KB
Your tags:
english, 2012
23
Immunity against temperature variability and bias point invariability in double gate tunnel field effect transistor
Rakhi Narang
,
Manoj Saxena
,
R.S. Gupta
,
Mridula Gupta
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 501 KB
Your tags:
english, 2012
24
Modular sensor chip design for package stress evaluation and reliability characterisation
A.D. Trigg
,
Tai Chong Chai
,
Xiaowu Zhang
,
Xian Tong Chen
,
Leong Ching Wai
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.60 MB
Your tags:
english, 2012
25
System-level design optimization of reliable and low power multiprocessor system-on-chip
Rishad A. Shafik
,
Bashir M. Al-Hashimi
,
Jeff S. Reeve
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 959 KB
Your tags:
english, 2012
26
Crystal size and direction dependence of the elastic properties of Cu3Sn through molecular dynamics simulation and nanoindentation testing
Wen-Hwa Chen
,
Ching-Feng Yu
,
Hsien-Chie Cheng
,
Su-Tsai Lu
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.66 MB
Your tags:
english, 2012
27
Impacts of NBTI/PBTI on performance of domino logic circuits with high-k metal-gate devices in nanoscale CMOS
Masaoud Houshmand Kaffashian
,
Reza Lotfi
,
Khalil Mafinezhad
,
Hamid Mahmoodi
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 502 KB
Your tags:
english, 2012
28
Synthesis and characterization of sub-micron sized copper–ruthenium–tantalum composites for interconnection application
R. Sule
,
P.A. Olubambi
,
B.T. Abe
,
O.T Johnson
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.44 MB
Your tags:
english, 2012
29
Fluid–solid coupling thermo-mechanical analysis of high power LED package during thermal shock testing
Zhaohui Chen
,
Qin Zhang
,
Kai Wang
,
Mingxiang Chen
,
Sheng Liu
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.04 MB
Your tags:
english, 2012
30
A study on MIS Schottky diode based hydrogen sensor using La2O3 as gate insulator
Gang Chen
,
Jerry Yu
,
P.T. Lai
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.45 MB
Your tags:
english, 2012
31
Thermal fatigue life estimation and delamination mechanics studies of multilayered MEMS structures
A.R. Maligno
,
D.C. Whalley
,
V.V. Silberschmidt
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 2.42 MB
Your tags:
english, 2012
32
Comparative analysis of yield optimized pulsed flip-flops
Marco Lanuzza
,
Raffaele De Rose
,
Fabio Frustaci
,
Stefania Perri
,
Pasquale Corsonello
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 811 KB
Your tags:
english, 2012
33
Characterization of the viscoelastic properties of an epoxy molding compound during cure
M. Sadeghinia
,
K.M.B. Jansen
,
L.J. Ernst
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 935 KB
Your tags:
english, 2012
34
Preliminary assessment of the stability of thin- and polymer thick-film resistors embedded into printed wiring boards
Wojciech Stęplewski
,
Tomasz Serzysko
,
Grażyna Kozioł
,
Andrzej Dziedzic
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 1.21 MB
Your tags:
english, 2012
35
ICMAT 2011 – Reliability and variability of semiconductor devices and ICs
Asen Asenov
,
Ulf Schlichtmann
,
Cher Ming Tan
,
Hei Wong
,
Xing Zhou
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 108 KB
Your tags:
english, 2012
36
Book review: Effective FMEAs
Nicholas Williard
,
Sony Mathew
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 109 KB
Your tags:
english, 2012
37
Inside front cover - Editorial board
Journal:
Microelectronics Reliability
Year:
2012
Language:
english
File:
PDF, 39 KB
Your tags:
english, 2012
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