Comparative analysis of yield optimized pulsed flip-flops

Microelectronics Reliability 2012 Vol. 52; Iss. 8

Comparative analysis of yield optimized pulsed flip-flops

Marco Lanuzza, Raffaele De Rose, Fabio Frustaci, Stefania Perri, Pasquale Corsonello
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Volume:
52
Year:
2012
Language:
english
DOI:
10.1016/j.microrel.2012.03.024
File:
PDF, 811 KB
english, 2012
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