A DRC-based algorithm for extraction of critical areas for...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1999 Vol. 18; Iss. 2

A DRC-based algorithm for extraction of critical areas for opens in large VLSI circuits

Pleskacz, W.A., Ouyang, C.H., Maly, W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
18
Year:
1999
Language:
english
DOI:
10.1109/43.743724
File:
PDF, 580 KB
english, 1999
Conversion to is in progress
Conversion to is failed