Scan-based BIST fault diagnosis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1999 Vol. 18; Iss. 2

Scan-based BIST fault diagnosis

Yuejian Wu, Adham, S.M.I.
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Volume:
18
Year:
1999
Language:
english
DOI:
10.1109/43.743733
File:
PDF, 263 KB
english, 1999
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